With halide perovskite gaining popularity
for optoelectronics application,
it is imperative to push for device stacks with minimum optical losses
and maximum efficiency. However, the vast plethora of material systems
and device architectures available through computerized combinatorial
analysis made experimental trials for each proposed possibility impractical.
Thus, high-throughput optical simulations in conjunction to comprehensive
electronic modeling are necessary to predict outputs and minimize
experimental efforts involved. Here, we aim to critically summarize
some of the most intuitive and efficient approaches to optical modeling
for perovskite-based devices and work toward a consensus on the best
avenues to utilize these models. First, the nuances of ellipsometry
measurements for ascertaining accurate optical constants of perovskite
are discussed. Modeling techniques (such as ray tracing, transfer
matrices, finite difference time domain, and finite element methods)
to simulate the optical interaction within the device are then elaborated
focusing on their advantages and limitations. Next, the primary challenges
to attaining greater accuracy of optical constant data as well as
insights on the future trends are identified. Finally, an interactive
flowchart-based decision tree to ascertain the best simulation technique
for a given optoelectronic device architecture is built, which will
greatly help experimental scientists and beginners in optical modeling.