Crystal Effects in the Neutralization of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msup><mml:mi>He</mml:mi><mml:mo>+</mml:mo></mml:msup></mml:math>Ions in the Low Energy Ion Scattering Regime

Primetzhofer, Daniel; Markin, S.N.; Juaristi, J. I.; Taglauer, E.; Bauer, Péter

doi:10.1103/physrevlett.100.213201

Cited by 34 publications

(29 citation statements)

References 20 publications

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“…It is presented together with the linear fit of a dataset acquired for a polar scan at E < E th exhibiting clear 1/v ⊥ -scaling (see Fig.3). Similar to the data presented for Cu(100) in [12] (2) is not sufficient to describe the observations. Similar to the high energy data presented for Cu(100) in [12] for the data shown in Fig.…”

Section: Resultssupporting

confidence: 68%

“…Similar to the data presented for Cu(100) in [12] (2) is not sufficient to describe the observations. Similar to the high energy data presented for Cu(100) in [12] for the data shown in Fig. 4a the resulting P + values are virtually identical for double alignment conditions, i.e.…”

Section: Resultssupporting

confidence: 68%

“…These findings are expected to have major impact on surface composition analysis using LEIS, and therefore we will discuss them in more details in this work. We further present additional data for Ag and show that it can be explained by the models developed in [12].…”

Section: Introductionmentioning

confidence: 99%

“…(2)). In a very recent work [ 12 ] we presented strong differences in the deduced ion fraction P + for different single crystalline and polycrystalline surfaces of a pure element, i.e. Cu and explained these crystal effects by the available qualitative models described above.…”

Section: Introductionmentioning

confidence: 99%

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LEIS: A reliable tool for surface composition analysis?

Primetzhofer

Markin

Juaristi³

et al. 2009

Nuclear Instruments and Methods in Physics Research Section B:

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Different single and polycrystalline surfaces of Cu and Ag have been investigated by Time-Of-Flight low-energy ion scattering using 4 He + ions. The fraction of ions that survived single scattering from the outermost surface layers, P + , was measured in different neutralization regimes. At low energies, a distinct difference in P + was observed for non-equivalent Cu crystal surfaces for projectiles backscattered in a single collision. The polycrystalline surface was found to exhibit similar neutralization behaviour as the (111) single crystal surface. At higher energies, P + shows a strong dependence on the angular orientation of the single crystal. The impact of these findings on quantitative surface composition analysis by LEIS is discussed.

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Section: Resultssupporting

confidence: 68%

Section: Resultssupporting

confidence: 68%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

LEIS: A reliable tool for surface composition analysis?

Primetzhofer

Markin

Juaristi³

et al. 2009

Nuclear Instruments and Methods in Physics Research Section B:

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“…The studies in [156] revealed non-negligible differences in the ion fractions of He + after scattering from Cu (110), (100) and polycrystalline surfaces, demonstrating that the so-called "matrix effects" have indeed to be considered in the analysis of low-energy ion scattering data for studies on the composition of solid surfaces. In this section we will compare experimental measurements of ion fractions and energy gains with theoretical calculations for these magnitudes using the Auger neutralization rates presented in section 3.…”

Section: Comparison Of Theory and Experimentsmentioning

confidence: 99%

Auger neutralization and ionization processes for charge exchange between slow noble gas atoms and solid surfaces

Monreal

2014

Progress in Surface Science

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Electron and energy transfer processes between an atom or molecule and a surface are extremely important for many applications in physics and chemistry. Therefore a profound understanding of these processes is essential in order to analyze a large variety of physical systems. The microscopic description of the two-electron Auger processes, leading to neutralization/ionization of an ion/neutral atom in front of a solid surface, has been a long-standing problem. It can be dated back to the 1950s when H. D. Hagstrum proposed to use the information contained in the spectrum of the electrons emitted during the neutralization of slow noble gas ions as a surface analytical tool complementing photoelectron spectroscopy. However, only recently a comprehensive description of the Auger neutralization mechanism has been achieved by the combined efforts of theoretical and experimental methods. In this article we review the theoretical models for this problem, stressing how their outcome compare with experimental results. We also analyze the inverse problem of Auger ionization. We emphasize the understanding of the key quantities governing the processes and outline the challenges remaining. This opens new perspectives for future developments of theoretical and experimental work in this field.

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Low‐Energy Ion Scattering

Brongersma¹

2012

Characterization of Materials

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Low‐energy ion scattering (LEIS), also called ion scattering spectroscopy (ISS), is a tool for the analysis of the atomic composition of the surface as well as for a nondestructive in‐depth analysis of the near surface (0–10 nm). The analysis is based on backscattering of noble gas ions (He + , Ne + , Ar + , or Kr + ) in the range of a few hundred to 10,000 eV. The extreme surface sensitivity of LEIS enables the selective analysis of the outermost atomic layer. This is precisely the layer that is largely responsible for many chemical and physical properties of materials. In combination with sputter depth profiling LEIS can also be used for the analysis of much deeper layers. Recent advances in the development of LEIS instruments now allow an essentially nondestructive (“static”) analysis, even of very sensitive materials like organic films. With the modern LEIS instruments one can analyze very rough amorphous insulating samples just as easily as conducting flat single crystals. The only restriction for samples being, that they can be put into vacuum for analysis. The applications of LEIS are, therefore, very wide and include important processes like adhesion, catalysis, diffusion, film growth, and electron emission. Alternative techniques include surface science tools, in particular X‐ray photoelectron spectroscopy (XPS), (TOF‐) SIMS, the high‐energy ion scattering techniques (HEIS), and medium‐energy ion scattering, MEIS.

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Crystal Effects in the Neutralization ofHe+Ions in the Low Energy Ion Scattering Regime

Cited by 34 publications

References 20 publications

LEIS: A reliable tool for surface composition analysis?

LEIS: A reliable tool for surface composition analysis?

Auger neutralization and ionization processes for charge exchange between slow noble gas atoms and solid surfaces

Low‐Energy Ion Scattering

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