2012 6th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT) 2012
DOI: 10.1109/setit.2012.6481905
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Crosstalk noise and signal propagation delay analysis in submicron CMOS integrated circuits

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Cited by 8 publications
(2 citation statements)
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“…The opacity of unknown lines affects the observed structure of stellar spectra, so extensive improvements in the accuracy and completeness of the atomic data are welcome. Recently, we have achieved semiempirical hyperfine structure (hfs) investigations in Zr II [7], Hf II [8] and Ti II [9]. This time we propose a similar study concerning Ta II, both for even-and odd-parity levels, since hfs of Ta II levels, large enough to modify the profiles of lines that might be detected in stellar spectra, are also of interest to the astrophysical community for abundance determination and spectrum synthesis.…”
Section: Introductionmentioning
confidence: 92%
“…The opacity of unknown lines affects the observed structure of stellar spectra, so extensive improvements in the accuracy and completeness of the atomic data are welcome. Recently, we have achieved semiempirical hyperfine structure (hfs) investigations in Zr II [7], Hf II [8] and Ti II [9]. This time we propose a similar study concerning Ta II, both for even-and odd-parity levels, since hfs of Ta II levels, large enough to modify the profiles of lines that might be detected in stellar spectra, are also of interest to the astrophysical community for abundance determination and spectrum synthesis.…”
Section: Introductionmentioning
confidence: 92%
“…Some challenges will be dominant in future IC design. On the one hand, the effect of inductance plays an important role when operating frequency is over several gigahertz [3,4] , and the effect can't be ignored [5,6] , on the other hand, for continued scaling of feature sizes, the influence of process variations is one of the most important factors on performance of VLSI [7] . So it is important to focus on modeling the impact of process variation on interconnect performance on reliability designs and optimization designs of VLSI [8,9] .…”
Section: Introductionmentioning
confidence: 99%