Statistical Interconnect Crosstalk Noise Model and Analysis for Process Variations

Low Overhead and Fast Reaction Adaptive Clocking System for Voltage Droop Tolerance

“…As process technologies advanced, integrated circuits have always been vulnerable to variations [1,2] . The most critical challenge is the variation of on-chip power supply, especially the fast voltage droop, which happens very rapidly (several clock cycles) from abrupt changes in switching activity.…”