2023
DOI: 10.1016/j.mejo.2023.105698
|View full text |Cite
|
Sign up to set email alerts
|

Crosstalk analysis of dielectric inserted side contact multilayer graphene nanoribbon interconnects for ternary logic system using unconditionally stable FDTD model

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 37 publications
0
3
0
Order By: Relevance
“…where L represents the interconnect length, M=[E f /ΔE], λ D is the mean free path affected by defect scattering, λ i is the mean free path affected by edge scattering in the i-th subband, and N ch,i is the number of conducting channels of the i-th subband [3].…”
Section: Equivalent Circuit Modelmentioning
confidence: 99%
See 2 more Smart Citations
“…where L represents the interconnect length, M=[E f /ΔE], λ D is the mean free path affected by defect scattering, λ i is the mean free path affected by edge scattering in the i-th subband, and N ch,i is the number of conducting channels of the i-th subband [3].…”
Section: Equivalent Circuit Modelmentioning
confidence: 99%
“…The p.u.l. inductance L pul and mutual inductance M pul of MLGNR interconnect have been given in [3].…”
Section: Contact Resistance and Other Parametersmentioning
confidence: 99%
See 1 more Smart Citation