Cross-correlation image tracking for drift correction and adsorbate analysis

Mantooth, Brent A.; Donhauser, Zachary J.; Kelly, Kevin F.; Weiss, Paul S.

doi:10.1063/1.1427417

Cited by 65 publications

(85 citation statements)

References 26 publications

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“…In general, however, the measurements break down into two major categories. First, there are break junction measurements [42,99,100], fabrication schemes [101], particular limits of crossed-wire, STM and nanodot collection measurements [102][103][104], in which one is presumably measuring a small number (ideally 1) of molecules. Second are measurements on adlayers, in which many thousands of molecules can contribute to the transport [105,106].…”

Section: Reliability Reproducibility Experimental Conditions and Swmentioning

confidence: 99%

Foundations of Molecular Electronics – Charge Transport in Molecular Conduction Junctions

Jortner¹,

Nitzan²,

Ratner³

Introducing Molecular Electronics

232

309

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Abstract. The most fundamental structure involved in molecular electronics is a molecular transport junction, consisting of one (ideally) or more molecules extending between two electrodes. These junctions combine the fundamental process of intramolecular electron transfer with the mixing of molecular and continuum levels at the electrodes and the nonequilibrium process of voltage-driven currents. Much of this book is devoted to the complicated but significant behaviors that arise from this conjunction. This introductory chapter attempts to sketch some of the principles and also some of the unresolved issues that characterize molecular transport junctions.Sections 2-4 deal with fundamental ideas. These include an appropriate theoretical formulation of the conductance calculation in terms of non-equilibrium Green's functions, the relationship between junction conductance and nonadiabatic electron transfer rates in the same molecular entities, and the role and magnitude of interactions between the dynamics of the transferring electronic charges and the nuclear degrees of freedom. Section 5 addresses some of the outstanding and difficult issues in understanding junction transport, including geometry and its change with voltage, the electrostatic profile under applied voltage, electronic structure models and their limitations, and fluctuations and switching phenomena in junctions.Molecular electronics is an area of very rapidly growing scientific and applied interest and activity. While the technological drivers, including materials, electrochemical, biological, sensing, memory and logic applications are all important, the fundamental issues involved in the nonequilibrium responses of molecule-based hybrid materials to applied electromagnetic fields is the fundamental driver for this science. In this sense, molecular electronics is a sort of spectroscopy. Due to the intensity and quality of the research being done in the area, the community may soon be able to understand molecular transport spectroscopy at a level of depth and sophistication almost comparable to other, more traditional spectroscopies. Contemporary research in the area, as exemplified in this book and at the Dresden conference that initiated the book, is driving in that direction.

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Section: Reliability Reproducibility Experimental Conditions and Swmentioning

confidence: 99%

Foundations of Molecular Electronics – Charge Transport in Molecular Conduction Junctions

Jortner¹,

Nitzan²,

Ratner³

Introducing Molecular Electronics

232

309

View full text Add to dashboard Cite

show abstract

“…Estimation of the drift from cross-correlation between successively measured topographic images enabled us to track a single molecule on a surface [14,15]. The atom-tracking method [16] using a circular motion of the tip over an individual molecule or atom provided effective drift compensation, and was applied to force spectroscopy of a single atom in ultrahigh vacuum [17].…”

Section: Methodsmentioning

confidence: 99%

Subnanometric stabilization of plasmon-enhanced optical microscopy

et al. 2012

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We have demonstrated subnanometric stabilization of tip-enhanced optical microscopy under ambient condition. Time-dependent thermal drift of a plasmonic metallic tip was optically sensed at subnanometer scale, and was compensated in real-time. In addition, mechanically induced displacement of the tip, which usually occurs when the amount of tip-applied force varies, was also compensated in situ. The stabilization of tip-enhanced optical microscopy enables us to perform long-time and robust measurement without any degradation of optical signal, resulting in true nanometric optical imaging with high reproducibility and high precision. The technique presented is applicable for AFM-based nanoindentation with subnanometric precision.

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“…Therefore, in order to obtain high-throughput of AFM-based nanomanipulation, it is very crucial to find effective ways to minimize or eliminate the distortion in the image before performing the manipulation. This image distortion caused by drift can be effectively corrected by cross correlation of subsequent images [20]- [22]. The correction after image acquisition, however, is unable to register the relative position between the tip and the nano-objects in real-time, which is required in manipulation.…”

Section: Correcting Distortion Of Afm Image By Local Scanmentioning

confidence: 99%

“…To compensate the drift distortion within the AFM image, correction after image acquisition is the usual way. After measuring the drift velocities either through imaging known structures [17]- [19] or by cross correlation of subsequent images [20], [21], the thermal drift can be compensated thus to remove the distortion in the image. The correction after image acquisition, however, is unable to register the relative position between the tip and the nano-objects, which is of critical importance for success of nanomanipulation.…”

Section: Introductionmentioning

confidence: 99%

Drift Compensation in AFM-Based Nanomanipulation by Strategic Local Scan

Wang

Liu

2012

IEEE Trans. Automat. Sci. Eng.

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Abstract-The drift distorts the atomic force microscopy (AFM) images as the time taken to acquire a complete AFM image is relatively long (a few minutes). As the AFM image is used as a reference for most manipulation mechanisms, the image distorted by drift will cause problems for AFM-based manipulation because the displayed positions of the objects under nanomanipulation do not match their actual locations. The drift during manipulation, similarly, will further exacerbate the mismatch between the displayed positions and the actual locations. Such mismatch is a major hurdle to achieve automation in AFM-based nanomanipulation. Without proper compensation, manipulation based on a wrong displayed location of the object often fails. In this paper, we present an algorithm to identify and eliminate the drift-induced distortion in the AFM image by applying a strategic local scan method. Briefly, after an AFM image is captured, the entire image is divided into several parts along vertical direction. A quick local scan is performed in each part of the image to measure the drift value in that very part. In this manner, the drift value is calculated in a small local area instead of the global image. Thus, the drift can be more precisely estimated and the actual position of the objects can be more accurately identified. In this paper, we also present the strategy to constantly compensate the drift during manipulation. By applying local scan on a single fixed feature in the AFM image frequently, the most current positions of all objects can be displayed in the augmented reality for real-time visual feedback.Notes to Practitioners-Fabrication of nanoscale devices by AFM-based manipulation has attracted much attention recently. However, it is a sequential approach and therefore the throughput is low. To increase the efficiency of AFM-based nanomanipulation, automation is considered to be the ultimate solution. Unfortunately, automation in AFM-based nanomanipulation is facing several technical hurdles. The thermal drift is one of them. Because of the presence of thermal expansion and contraction, the relative position between the tip and the sample undergoes drift with respect to time. Therefore, the AFM images are often distorted due to the thermal drift because the time taken to acquire a complete AFM image is in the range of minutes. This paper tries to tackle this problem by compensating the thermal drift through direct measurement of the thermal drift by local scan. The direct measurement not only can be used to correct Manuscript received December 07, 2011; revised June 14, 2012; accepted July 20, 2012 the drift-induced distortion in the initial AFM image, it can also be used to compensate the real-time drift during manipulation. Starting from a drift-clean image at the beginning and with drift being compensated in real-time during manipulation, the AFM-based nanomanipulation can be more accurate and efficient. The research results here is one of the important steps to achieve full automation in AFM-based nanomanipulation.

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Cross-correlation image tracking for drift correction and adsorbate analysis

Cited by 65 publications

References 26 publications

Foundations of Molecular Electronics – Charge Transport in Molecular Conduction Junctions

Foundations of Molecular Electronics – Charge Transport in Molecular Conduction Junctions

Subnanometric stabilization of plasmon-enhanced optical microscopy

Drift Compensation in AFM-Based Nanomanipulation by Strategic Local Scan

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