2017
DOI: 10.1016/j.actamat.2017.03.056
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Creep behavior of submicron copper films under irradiation

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Cited by 13 publications
(1 citation statement)
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“…An alternative approach is to use heavy ions, which better simulate the neutron damage and do not activate the matter, but have an even more limited penetration than light ions. Despite the efforts of few research teams to use miniaturized specimen coupled with heavy ion beams [7,8,9,10,11,12,13,14,15], the access to the underlying irradiation creep mechanisms remains indirect. The in-situ imaging of crystal defects under both straining and heavy ion irradiation inside a TEM can allow for a direct access to the active mechanisms [16].…”
Section: Introductionmentioning
confidence: 99%
“…An alternative approach is to use heavy ions, which better simulate the neutron damage and do not activate the matter, but have an even more limited penetration than light ions. Despite the efforts of few research teams to use miniaturized specimen coupled with heavy ion beams [7,8,9,10,11,12,13,14,15], the access to the underlying irradiation creep mechanisms remains indirect. The in-situ imaging of crystal defects under both straining and heavy ion irradiation inside a TEM can allow for a direct access to the active mechanisms [16].…”
Section: Introductionmentioning
confidence: 99%