Proceedings of the 5th Conference on Computing Frontiers 2008
DOI: 10.1145/1366230.1366258
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Credit-based dynamic reliability management using online wearout detection

Abstract: As circuit geometries continue to shrink, and supply voltages re main relatively constant, circuit wearout becomes a concern. We propose that the relative reliability of the circuits of a processor be exposed to the operating system, and be managed by a credit-based wearout monitor. This wearout monitor receives dynamic updates of the reliability of circuits through the use of stability detector cir cuits that are small enough to be widely deployed. We find that through the combined use of the wearout monitor … Show more

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Cited by 4 publications
(5 citation statements)
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References 16 publications
(20 reference statements)
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“…We assume that each chip is equipped with an advanced builtin-self-test(BIST) module, that can detect faulty cores and capture performance variances when a device starts. Note that simple modules such as those introduced in [16], [6] can be easily incorporated into a multi-core platform for detecting purpose. The performance characteristics captured by the BIST module will be used to mirror the logical architecture to the underlying physical architecture with the goal of maximizing the application performance.…”
Section: Introductionmentioning
confidence: 99%
“…We assume that each chip is equipped with an advanced builtin-self-test(BIST) module, that can detect faulty cores and capture performance variances when a device starts. Note that simple modules such as those introduced in [16], [6] can be easily incorporated into a multi-core platform for detecting purpose. The performance characteristics captured by the BIST module will be used to mirror the logical architecture to the underlying physical architecture with the goal of maximizing the application performance.…”
Section: Introductionmentioning
confidence: 99%
“…Consequently, aging models were proposed to estimate the wear-out of non-critical systems, which do not require protection against transient faults, based on prior knowledge of the executed applications [30]. Unfortunately, the accuracy of the aging models is severely limited by unknown environmental conditions, manufacturing variations, unavailable technology information and insufficiently understood physics of some aging mechanisms [25].…”
Section: Introductionmentioning
confidence: 99%
“…In order to better cope with the inaccuracy of the aging models [25], self-tests performed concurrently with the normal operation may be used to improve the fault detection latency and the failure prediction capability [12] [28]. A way to avoid the impact on system performance is to execute these tests during idle periods.…”
Section: Introductionmentioning
confidence: 99%
“…We assume that each chip is equipped with an advanced built-in-self-test(BIST) module, that can detect faulty cores and capture performance variances when a device starts. Note that simple modules such as those introduced in [129,94] can be easily incorporated into a multi-core platform for detecting purpose. The performance characteristics captured by the BIST module will be used to mirror the logical architecture to the underlying physical architecture with the goal of maximizing the application's performance.…”
Section: Related Workmentioning
confidence: 99%
“…Significant achievements have been made on layout techniques and other device technologies by adding built-in sensors or redundant devices [94,129,95]. However, it becomes increasingly challenging as transistor size scales towards dimensions close to or below 10 nm [154].…”
Section: Related Workmentioning
confidence: 99%