Cr-Cs – Cu-Zr
DOI: 10.1007/10086090_991
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Cr-N (Chromium-Nitrogen)

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Cited by 2 publications
(3 citation statements)
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“…The crystal structure of the coated ceramic films was determined by X-ray diffraction (XRD) using aB ruker D4 endeavor diffractometer applying Cu Ka (l = 1.54 )r adiation. To minimize disturbing signals caused by the aluminum substrate, the measurements were performed with the grazing incidence method (38)with adiffraction angle of 108 to 908.…”
Section: Characterization Of Ceramic Coatingsmentioning
confidence: 99%
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“…The crystal structure of the coated ceramic films was determined by X-ray diffraction (XRD) using aB ruker D4 endeavor diffractometer applying Cu Ka (l = 1.54 )r adiation. To minimize disturbing signals caused by the aluminum substrate, the measurements were performed with the grazing incidence method (38)with adiffraction angle of 108 to 908.…”
Section: Characterization Of Ceramic Coatingsmentioning
confidence: 99%
“…In this work, we report the surface modification of the Al current collector by ceramic coating with chromium nitride (Cr x N) as well as the electrochemical characterization of the anodic dissolution behavior. In general, the Cr–N binary system is characterized by the presence of two intermediate phases, Cr 2 N and CrN, in the solid state . By utilizing the physical method of magnetron sputter deposition, two different coating types were prepared and characterized regarding their structure, electronic conductivity, and surface properties.…”
Section: Introductionmentioning
confidence: 99%
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