Correlations between well potential and SEUs measured by well-potential perturbation detectors in 65nm

Furuta, Jun; Yamamoto, Ryōichi; Kobayashi, Kazutoshi; Onodera, Hidetoshi

doi:10.1109/asscc.2011.6123639

Cited by 5 publications

(3 citation statements)

References 10 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…As shown in Fig. 6 and our previous work [13], WPP is weakly overlapped with SEUs on FFs. The WPP detector or bulk built-in current sensor cannot detect all SEU on FFs.…”

Section: Resultssupporting

confidence: 69%

“…In this paper, we show actual measurement results of well-potential perturbation by neutron irradiation using wellpotential perturbation detectors based on [13]. We also show the relationship between well-potential perturbations and MCU occurrences on FFs.…”

Section: Introductionmentioning

confidence: 99%

“…Fig. 1 shows unit circuits of the well-potential perturbation detector [13]. They consist of AND / OR chains and two time-to-digital converters (TDCs) based on the ring oscillator [14].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Effects of Neutron-Induced Well Potential Perturbation for Multiple Cell Upset of Flip-Flops in 65 nm

Furuta

Yamamoto

Kobayashi

et al. 2013

IEEE Trans. Nucl. Sci.

Self Cite

View full text Add to dashboard Cite

We measure and investigate the relationship between well potential perturbation and MCUs (Multiple Cell Upsets) by neutron irradiation. Area-efficient cell-based perturbation detectors are placed adjacent to FFs (Flip-Flops). They can measure duration time of perturbation with 5 µm spatial resolution at two voltage levels. The measurement results by neutron irradiation on a 65-nm bulk CMOS show that 95% of MCUs occur simultaneously with well-potential perturbation, while there is very weak relationship between SEUs (Single Event Upsets) and the perturbation.

show abstract

“…As shown in Fig. 6 and our previous work [13], WPP is weakly overlapped with SEUs on FFs. The WPP detector or bulk built-in current sensor cannot detect all SEU on FFs.…”

Section: Resultssupporting

confidence: 69%

Section: Introductionmentioning

confidence: 99%