1987
DOI: 10.1180/minmag.1987.051.359.04
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Convergent beam electron diffraction

Abstract: In convergent-beam electron diffraction (CBED) a highly convergent electron beam is focussed on to a small (~< 50 nm) area of the sample. Instead of the diffraction spots that are obtained in the back focal plane of the objective lens with parallel illumination in conventional selected-area electron diffraction, CBED produces discs of intensity. The point group can be determined uniquely from the symmetry within the individual discs and the overall pattern. In order to determine the point group, it is usually … Show more

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Cited by 20 publications
(9 citation statements)
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(36 reference statements)
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“…1976; Champness, 1987). It is also potentially capable of demonstrating unambiguously whether or not a phase has a center of inversion and of identifying translational symmetry elements by observation of the extinction cross in kinematically-forbidden discs (Gjonnes and Moodie, 1965).…”
Section: •• Mel: Melilitementioning
confidence: 99%
“…1976; Champness, 1987). It is also potentially capable of demonstrating unambiguously whether or not a phase has a center of inversion and of identifying translational symmetry elements by observation of the extinction cross in kinematically-forbidden discs (Gjonnes and Moodie, 1965).…”
Section: •• Mel: Melilitementioning
confidence: 99%
“…The next step was to obtain a CBED pattern corresponding to the three-fold axis in order to measure the radius of the first order Laue zone (FOLZ) ring. Its radius gives approximately the spacing of crystal planes in the direction of the zone axis along which the electron beam is directed according to the equation (e.g., Champness, 1987)…”
Section: General Observations By Atemmentioning
confidence: 99%
“…In the third paper of this series (Barber and Agrell, 1994), an occurrence of UNK from a furnace slag is described. Using CBED methods (Steeds, 1979;Williams, 1984;Champness, 1987), we establish that the space group of crystals. from the slag is either P3m1 or P31m; therefore, we use four-digit Miller-Bravais indices and hexagonal axes throughout this paper in describing the crystallography ofUNK.…”
Section: Introductionmentioning
confidence: 99%
“…Figure 1 shows a comparison between conventional transmitted electron microscopy ͑TEM͒ and CBED. [14][15][16] In conventional TEM, a parallel beam is used to illuminate the specimen and the diffraction pattern consists of sharp spots. On the other hand, in CBED, a convergent beam is used to illuminate the specimen and the diffraction pattern consists of disks.…”
Section: Introductionmentioning
confidence: 99%