2023
DOI: 10.1039/d3ra00805c
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Controlling barrier height and spectral responsivity of p–i–n based GeSn photodetectors via arsenic incorporation

Abstract: Metal induced crystallization (MIC), strained Ge doped with Sn and As, p–i–n photodetectors, tuned direct transitions, spectral responsivity.

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Cited by 5 publications
(2 citation statements)
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“…Moreover, GeSn alloys show bandgap tunability, a high carrier saturation velocity [ 9 ], high carrier mobility [ 10 ], and a large absorption coefficient [ 11 ]. These unique characteristics have encouraged the development of efficient GeSn-based SWIR and MIR PDs [ 8 , 9 , 10 , 11 , 12 , 13 , 14 , 15 , 16 , 17 ]. Furthermore, a special momentum (k)-space carrier separation scheme enhances the optical performance of the GeSn PDs [ 18 ].…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, GeSn alloys show bandgap tunability, a high carrier saturation velocity [ 9 ], high carrier mobility [ 10 ], and a large absorption coefficient [ 11 ]. These unique characteristics have encouraged the development of efficient GeSn-based SWIR and MIR PDs [ 8 , 9 , 10 , 11 , 12 , 13 , 14 , 15 , 16 , 17 ]. Furthermore, a special momentum (k)-space carrier separation scheme enhances the optical performance of the GeSn PDs [ 18 ].…”
Section: Introductionmentioning
confidence: 99%
“…Although there have been numerous reports about the dark current densities of GeSn-based PDs [31][32][33][34][35][36][37][38][39][40], very little has been done to clarify the various contributors to the dark-current-density GeSn PDs with different Sn concentrations and the effect of defect density, limiting the optimization of GeSn PDs to achieve uncooled and high-performance MIR photodetection. A few recent experimental studies have shed light on the contributing components of dark currents, such as minority carrier diffusion, Shockley-Read-Hall (SRH) generation-recombination (GR), and trap-assisted tunneling (TAT), providing evidence that the dark current of GeSn PDs is lower with lower defect densities [41][42][43]. This intended to further study the effect of defect density on the PD performance by establishing a theoretical model upon which material and device developers can form realistic expectations in developing GeSn PD architectures for various applications.…”
Section: Introductionmentioning
confidence: 99%