2015
DOI: 10.1088/0957-4484/26/35/355706
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Controlled MoS2 layer etching using CF4 plasma

Abstract: A few-layered molybdenum disulfide (MoS2) thin film grown by plasma enhanced chemical vapor deposition was etched using a CF4 inductively coupled plasma, and the possibility of controlling the MoS2 layer thickness to a monolayer of MoS2 over a large area substrate was investigated. In addition, damage and contamination of the remaining MoS2 layer surface after etching and a possible method for film recovery was also investigated. The results from Raman spectroscopy and atomic force microscopy showed that one m… Show more

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Cited by 57 publications
(51 citation statements)
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“…Additionally, RIE processes are largely anisotropic in nature. Some popular plasma species for etching TMDCs include O 2 , 41-44 CF 4 , 41,45 and SF 6 . 46 Fluorinated plasma species (and other halogen species) are popular etching plasmas due to their high electronegatively.…”
Section: Plasma and Reactive Ion Etching (Rie)mentioning
confidence: 99%
“…Additionally, RIE processes are largely anisotropic in nature. Some popular plasma species for etching TMDCs include O 2 , 41-44 CF 4 , 41,45 and SF 6 . 46 Fluorinated plasma species (and other halogen species) are popular etching plasmas due to their high electronegatively.…”
Section: Plasma and Reactive Ion Etching (Rie)mentioning
confidence: 99%
“…Raman spectroscopic mapping confirms no D band in the planes of the resultant graphene, indicating etching only selectively occurs at the edges. In most cases, the plasma etching is used to thin down graphene (in basal plane) and other layered materials with controlled thickness, which enables studies on the layer‐dependent properties of 2D materials. Xiao et al demonstrated a soft and high throughput RF plasma etching of MoS 2 in SF 6 /N 2 (4.5:1) plasma .…”
Section: Plasmas In Electrochemical Energy Conversion and Storage Matmentioning
confidence: 99%
“…Though various etching schemes have been explored, [19][20][21][22][23][24][25][26][27][28][29] a scalable and controllable thickness reduction down to the mono-or few-layer regimes starting from arbitrary thickness and area has not been demonstrated. Methods utilizing material chemistry exploit either harsh chemicals 19 or reactive plasma environment, are material specific.…”
mentioning
confidence: 99%
“…Methods utilizing material chemistry exploit either harsh chemicals 19 or reactive plasma environment, are material specific. [21][22][23]28 Physical etching involves high temperature annealing, 25,27 laser assisted thermal ablation 20 or plasma environments, 24,26,29 results in degraded electrical properties. Postetch electrical characterization has not been performed in most cases, except for a few.…”
mentioning
confidence: 99%