2009
DOI: 10.1088/0022-3727/42/18/185302
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Control of the epitaxial orientation and reduction of the interface leakage current in YMnO3/GaN heterostructures

Abstract: Epitaxial ferroelectric YMnO3 (YMO) thin films with high crystalline quality were fabricated on (0 0 0 1) GaN substrates by pulsed laser deposition followed by rapid thermal annealing. X-ray diffraction and transmission electron microscopy measurements reveal that YMO layers are of (0 0 0 1) orientation with an in-plane epitaxial relation (0 0 0 1)YMO‖(0 0 0 1)GaN, . The orientation of the lattice of YMO was found to be controlled by the annealing conditions. Y2O3 nanocrystallites observed near the interface … Show more

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Cited by 7 publications
(4 citation statements)
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“…The present work is on thin film form since thin films offer controlled way to synthesize multiferroic materials with the possibility of either modified ferroelectric properties or enhancement in magneto-electric/elastic coupling by manipulating the substrate induced strain, grain boundaries, and vacancies. [13][14][15][16][17] Among various techniques to grow thin films, pulsed laser deposition (PLD) technique has been successfully employed in the study of thin films of hexagonal YMnO 3 . 8,15-18 Though the report on core level study of sputtered films is available in the literature, 19 not much is known regarding the VBS of h-YMnO 3 thin film.…”
mentioning
confidence: 99%
“…The present work is on thin film form since thin films offer controlled way to synthesize multiferroic materials with the possibility of either modified ferroelectric properties or enhancement in magneto-electric/elastic coupling by manipulating the substrate induced strain, grain boundaries, and vacancies. [13][14][15][16][17] Among various techniques to grow thin films, pulsed laser deposition (PLD) technique has been successfully employed in the study of thin films of hexagonal YMnO 3 . 8,15-18 Though the report on core level study of sputtered films is available in the literature, 19 not much is known regarding the VBS of h-YMnO 3 thin film.…”
mentioning
confidence: 99%
“…27,28,47,48 The remaining range of Mn-rich compositions did not show this secondary phase. 28 Not only off-stoichiometric films of YMnO 3 but also stoichiometric thin films of YMnO 3 showed presence of Y 2 O 3 nanoprecipitates, 49,50 where it was argued that a Mn/Y ratio below unity in the starting amorphous layer could yield the driving force for precipitation of Y 2 O 3 . According to the present microscopic investigation Mn deficient lattices (x < 1), the limit of solid solubility must be close to x = 0.95, with lattice images displaying well-defined atomic arrangement in the main phase (not shown here).…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…However, the authors only discussed the leakage current and conduction mechanism of the In/YMO/GaN capacitor and this study helped in reducing the undesired leakage later. The control of the epitaxial orientation and reduction of the interface leakage current in YMO/GaN heterostructures were examined as this can benefit the potential device applications [105].…”
Section: 12mentioning
confidence: 99%