2004
DOI: 10.1021/la049264f
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Control of Surface Properties Using Fluorinated Polymer Brushes Produced by Surface-Initiated Controlled Radical Polymerization

Abstract: Surface-grafted styrene-based homopolymer and diblock copolymer brushes bearing semifluorinated alkyl side groups were synthesized by nitroxide-mediated controlled radical polymerization on planar silicon oxide surfaces. The polymer brushes were characterized by X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorption fine structure (NEXAFS), and time-dependent water contact angle measurements. Angle-resolved XPS studies and water contact angle measurements showed that, in the case of the diblock cop… Show more

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Cited by 85 publications
(59 citation statements)
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“…X-ray Photoelectron Spectroscopy (XPS) can also be used for surface characterization as it probes a depth of ~10 nm. Most often XPS is used to confirm brush growth, to study surface chemical composition of the brush and to determine surface densities of bound molecules on the brush [138][139][140][141][142]. XPS has also been used for initiator-coated surfaces, however most of these studies have been limited to qualitative confirmation of the presence of initiator groups [143][144][145][146].…”
Section: Quantifying Surface Functional Groups: Initiator Densitymentioning
confidence: 99%
“…X-ray Photoelectron Spectroscopy (XPS) can also be used for surface characterization as it probes a depth of ~10 nm. Most often XPS is used to confirm brush growth, to study surface chemical composition of the brush and to determine surface densities of bound molecules on the brush [138][139][140][141][142]. XPS has also been used for initiator-coated surfaces, however most of these studies have been limited to qualitative confirmation of the presence of initiator groups [143][144][145][146].…”
Section: Quantifying Surface Functional Groups: Initiator Densitymentioning
confidence: 99%
“…For a melt brush the most common measure of whether it is in the brush or mushroom regime is the ratio of brush thickness ͑z͒ to radius of gyration ͑Rg͒. 38 The radius of gyration of the polymer as formed in solution is estimated as a͑N /6͒ 1/2 with a being the unit length of PEG 45 ͑0.52 nm͒ and N the degree of polymerization ͑45͒. So for a PEG 45 polymer Rg is equal to 0.52͑45/ 6͒ 1/2 = 1.42 nm.…”
Section: B X-ray Reflectivity Characterization Of Peg-lipid Surfacesmentioning
confidence: 99%
“…The second block composed of styrene monomers, results in physicochemical changes, as studied by X-ray photoelectron spectroscopy (XPS) or water contact angle measurements. In addition, it demonstrated the living nature of NMRP after the first block synthesis [195]. Recently, using a similar strategy, this group realized the nitroxide-mediated polymerization of styrenic monomers containing oligo(ethylene glycol) side chains on silicon wafers.…”
Section: Nmrpmentioning
confidence: 99%
“…Figure 11. Polymer brushes grown by nitroxide-mediated polymerization (adapted from reference [195]). [199]).…”
Section: Atrpmentioning
confidence: 99%