2018
DOI: 10.1016/j.mssp.2017.11.001
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Control of polysilicon nanowires conductivity by angle-dependent ion implantation

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Cited by 4 publications
(2 citation statements)
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“…Further, doping of the SiNWs is challenging considering the nanowire structure. Ion implantation is one of the prominent doping techniques for at Si surfaces; however, the method fails for SiNW due to doping nonuniformity caused by the ions aggregation at the SiNW bottom [21]. Molecular beam epitaxy and CVD are expensive and require hazardous precursors [22].…”
Section: Introductionmentioning
confidence: 99%
“…Further, doping of the SiNWs is challenging considering the nanowire structure. Ion implantation is one of the prominent doping techniques for at Si surfaces; however, the method fails for SiNW due to doping nonuniformity caused by the ions aggregation at the SiNW bottom [21]. Molecular beam epitaxy and CVD are expensive and require hazardous precursors [22].…”
Section: Introductionmentioning
confidence: 99%
“…Однако эффективность данного метода модификации очевидна. В работе [6] показано, что облучение ионами бора при разных углах падения пучка позволяет управлять проводимостью подложки из кремниевых нанонитей. В [7] показана возможность управления смачиваемостью кремниевых нанонитей при воздействии на мишень протонным пучком.…”
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