Abstract. Nowadays most setups of Tip-enhanced Raman Spectroscopy use the commercial Scanning Probe Microscope that is not designed for TERS, which results in narrow operation space, small scanning scope, etc. In this paper, a scanning stage system for TERS is designed. The system is driven by piezoelectric ceramic and uses capacitive sensor as the feedback of displacement to compensate the hysteresis and creep effect of piezoelectric ceramics. This paper introduces the mechanical structure of the system and the principle of the signal processing circuit of the capacitive sensor. The mechanical structure is simulated and the capacitive sensor is calibrated. The experimental results indicated that the system can realize the scanning scope of 20μm, and the capacitance sensor has high precision and good repeatability.