2008
DOI: 10.1063/1.2937837
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Contribution of dielectrics to frequency and noise of NbTiN superconducting resonators

Abstract: We study NbTiN resonators by measurements of the temperature dependent resonance frequency and frequency noise. Additionally, resonators are studied covered with SiO x dielectric layers of various thicknesses. The resonance frequency develops a nonmonotonic temperature dependence with increasing SiO x layer thickness. The increase in the noise is independent of the SiO x thickness, demonstrating that the noise is not dominantly related to the low temperature resonance frequency deviations.

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Cited by 103 publications
(112 citation statements)
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“…The noise level is also found to increase with increasing loss tangent, consistent with noise increasing with increasing density of TLFs [4] [22]. At low temperatures there exists a power dependence of the noise which could scale similar to the P −1/2 int dependence suggested by Gao et al [23] however more measurements are required to verify the exact power dependence.…”
Section: (See Supplemental Materials At [Url] For [Spectral Analysis])supporting
confidence: 57%
“…The noise level is also found to increase with increasing loss tangent, consistent with noise increasing with increasing density of TLFs [4] [22]. At low temperatures there exists a power dependence of the noise which could scale similar to the P −1/2 int dependence suggested by Gao et al [23] however more measurements are required to verify the exact power dependence.…”
Section: (See Supplemental Materials At [Url] For [Spectral Analysis])supporting
confidence: 57%
“…NbTiN has a minimal dielectric layer compared to Nb, Al and Ta. 8 We find that in the single photon regime the quality factor of NbTiN resonators is so high that the loss is largely due to the exposed substrate. In contrast, for Ta resonators the quality factor is limited by the metal surface.…”
mentioning
confidence: 96%
“…A key parameter limiting the performance is the energy relaxation time T 1 , while dephasing is relatively unimportant [7]. Resonator performance has typically been determined through classical measurements of the quality factor, and much work has yet to be done to understand the physics of the loss mechanisms and to optimize resonator designs for best performance [8,9,10,11,12].…”
mentioning
confidence: 99%
“…A key parameter limiting the performance is the energy relaxation time T 1 , while dephasing is relatively unimportant [7]. Resonator performance has typically been determined through classical measurements of the quality factor, and much work has yet to be done to understand the physics of the loss mechanisms and to optimize resonator designs for best performance [8,9,10,11,12].Here we show how several previously untested loss mechanisms can be eliminated or optimized to reach a measured quality factor Q m in the 200,000 to 400,000 range at low power, while the intrinsic quality factor Q i is even higher after subtraction of the coupling capacitor limited Q c . We provide detailed evidence that surface loss from two-level state (TLS) defects is an important loss mechanism.…”
mentioning
confidence: 99%