Contamination and radiation effects on spaceflight laser systems

Abdeldayem, Hossin; Dowdye, Edward; Canham, John S.; Jaeger, Todd

doi:10.1117/12.622345

Cited by 9 publications

(6 citation statements)

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“…This unwanted deposition process, referred as Laser-Induced Contamination (LIC), can be responsible for an accelerated transmission loss and finally non-reversible laser damage of the optical components, possibly causing laser failure. [18][19][20][21][22] This effect is critical for the industrial applications, and it has mainly been studied in the context of space applications: several past spaceflight missions using ns UV lasers proved to be short-lived and unreliable due to this effect, which has initiated an active field of research between space and laser communities. [23][24][25][26][27][28][29][30] LIC effects in the fs/ps regime have not been reported in the opened literature up to now but our investigations on laser components have led us to the 3 conclusion that these effects are also particularly detrimental in this regime and can be a main limitation of short wavelength high average power fs/ps lasers (Figure 1).…”

Section: Introductionmentioning

confidence: 99%

Analysis of laser-induced contamination at 515 nm in the sub-ps/MHz regime

Reaidy

Gallais

2020

Opt. Eng.

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We study Laser-Induced Contamination (LIC) as a potential cause of optical losses and Laser-Induced Damage (LID) of optical components for ultrashort pulse lasers with high average power in the MHz regime. Our work is conducted on dichroic mirrors designed for maximum reflection at 515nm operated in ambient air. Based on the development of an experimental set-up for real time monitoring of LIC and accelerated test protocols, we have conducted a parametric study on LIC development and studied its growth dynamics and morphology. We show that LIC is a main limitation of short wavelength high average power fs/ps lasers, with the formation of nanometric highly absorbing layers of carbonate compounds on the laser footprint, with evidence of thermal effects. It is also found that the last layer of the stack, at the interface between air and coating stack, is critical in the LIC growth which can open some perspectives for limitation of this effect.

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Section: Introductionmentioning

confidence: 99%

Analysis of laser-induced contamination at 515 nm in the sub-ps/MHz regime

Reaidy

Gallais

2020

Opt. Eng.

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“…Interestingly, even when components exhibit high laser-induced damage threshold (LIDT) fluence, their long-term reliability may be restricted to fluences much lower than the LIDT value (Abdeldayem et al, 2005). This reduction in reliable laser operation lifetime is linked to a detrimental phenomenon known as laser-induced contamination (LIC) El Reaidy and Gallais, 2020).…”

Section: Introductionmentioning

confidence: 99%

Investigation of laser-induced contamination on dielectric thin films in MHz sub-ps regime

Stehlik,

Zideluns,

Petite

et al. 2024

Adv. Opt. Technol.

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High-repetition rate diode-pumped sub-ps lasers are widely used in the industrial sector for high-quality material processing applications. However, for their reliable operation, it is crucial to study the power handling capabilities of the optical components used in these systems. The optical components, such as mirrors, gratings, dichroic filters, and gain media, are designed based on dielectric thin films. When subjected to high-intensity laser radiation, the phenomenon of laser-induced contamination (LIC) can lead to the growth of a nanometric, highly absorbent layer on an irradiated optical surface, which can result in transmission or reflection loss and eventual permanent damage. In this study, we investigate LIC growth on dielectric oxide thin films in an air environment irradiated by MHz sub-ps laser at 515 nm. We examine the effect of thin film deposition method, material, and thickness on LIC growth dynamics. The irradiated spots on the surface are inspected using multiple observation methods, including white light interference microscopy and fluorescence imaging. Our results show that the LIC growth dynamics depend on the laser intensity and irradiation time and can be affected by the thin film deposition method, material, and thickness. These findings could be used to inform the development of more resistant optical components, ensuring long-term reliable laser operation required for industrial applications. The study highlights the need for validating optical components using tests that closely mimic real-world applications and provides insight into the complex processes that lead to LIC.

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“…Interestingly, even when components exhibit high LIDT fluence, their long-term reliability may be restricted to fluences much lower than the LIDT value. 9 This reduction in reliable laser operation lifetime is linked to a detrimental phenomenon known as laser-induced contamination (LIC). 10,11 The LIC process refers to the growth of a nanometric layer on an irradiated optical surface, see Fig.…”

Section: Introductionmentioning

confidence: 99%

“…20,21 It has been proven that LIC caused unreliable and short-term operation of nanosecond UV lasers used in spaceflight missions. 9,16,22 In work, 23 it has been demonstrated that coating optics with fluorinated films is a potential strategy for preventing the formation of an organic contamination layer.…”

Section: Introductionmentioning

confidence: 99%

Sub-ps MHz green laser-induced contamination on dielectric coatings in air

Stehlik

Zideluns²,

Wagner³

et al. 2022

Laser-Induced Damage in Optical Materials 2022

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Laser-induced contamination (LIC) degrades the performance of optical components and can result in optical losses or even laser-induced damage. LIC deposit formation limits reliable operation of high repetition rate industrial lasers. In this work, we investigate LIC growth on dielectric oxide thin films in air environment irradiated by MHz sub-ps laser at 515 nm. We study the LIC growth dynamic in dependence on thin film deposition method, thin film material and thin film thickness.

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Contamination and radiation effects on spaceflight laser systems

Cited by 9 publications

References 0 publications

Analysis of laser-induced contamination at 515 nm in the sub-ps/MHz regime

Analysis of laser-induced contamination at 515 nm in the sub-ps/MHz regime

Investigation of laser-induced contamination on dielectric thin films in MHz sub-ps regime

Sub-ps MHz green laser-induced contamination on dielectric coatings in air

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