2008
DOI: 10.1039/b808435a
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Contact resistance and electrode material dependence of air-stable n-channel organic field-effect transistors using dimethyldicyanoquinonediimine (DMDCNQI)

Abstract: N-channel organic field-effect transistors with stable performance at ambient conditions are fabricated on the basis of an electron-accepting molecule, dimethyldicyanoquinone diimine (DMDCNQI). The transistors are investigated by varying source and drain electrode materials: Au, Ag, Cu, and a highly conducting organic charge-transfer salt, (tetrathiafulvalene)(tetracyanoquinodimethane) [(TTF)(TCNQ)]. The devices with the Au electrode show lowest contact resistance and highest electron mobility (0.011 cm 2 V À1… Show more

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Cited by 40 publications
(40 citation statements)
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“…49,50 Contact effect is sometimes important in two-probe organic transistors. Contact resistance of DMDCNQI transistors has been estimated to be 100 k cm by the transfer line method, 40 and is much smaller than the channel resistance which amounts to more than 1000 k cm. Accordingly, contact resistance of DMDCNQI transistors is relatively small.…”
Section: Variable Temperature Characteristicsmentioning
confidence: 99%
See 1 more Smart Citation
“…49,50 Contact effect is sometimes important in two-probe organic transistors. Contact resistance of DMDCNQI transistors has been estimated to be 100 k cm by the transfer line method, 40 and is much smaller than the channel resistance which amounts to more than 1000 k cm. Accordingly, contact resistance of DMDCNQI transistors is relatively small.…”
Section: Variable Temperature Characteristicsmentioning
confidence: 99%
“…Cy-NDI shows outstanding performance among the n-channel materials, with the reported mobility of 6.2 cm 2 /Vs due to the good thin-film morphology and the highly symmetrical brickwork packing of the planar molecules. 39 A small-molecule organic electron acceptor, DMDCNQI, forms air-stable n-channel transistors, 40,41 and recently, improved performance has been attained (μ = 0.23 cm 2 /Vs, on/off ratio = 2 × 10 6 , V T = 0 V) using the low vacuum evaporation method, though the threshold voltage is more susceptible to the surface treatment due to the trap states induced during the low vacuum evaporation. 42 In order to study the trap states, we have investigated the characteristics of these transistors in the temperature range between 260 K and 200 K. From the Arrhenius plot of the transconductance measured at low temperatures, we have studied gate voltage (V G ) dependence of the activation energy (E A ), and extracted the trap DOS from Lang's method, 33 as well as another method based on the E A vs. log V G plot.…”
Section: Introductionmentioning
confidence: 99%
“…Highly doped n-type silicon wafers with thermally grown silicon dioxide layers of 300 nm thickness were treated with polystyrene (PS) and hexamethyldisilazane (HMDS). 50,51 In addition, bare SiO 2 surface was investigated; in order to investigate particularly OH enhanced substrate, the substrate was used after the ultraviolet irradiation (Technovision model 208). The capacitance of the gate dielectric was C = 13.7 nF/cm 2 .…”
Section: Methodsmentioning
confidence: 99%
“…46 Since metal complexes exhibit a wide variety of redox potentials, several metal complexes are excellent electron acceptors. Some metal complexes show n-channel performance, though others show p-channel performance.…”
Section: ¹1mentioning
confidence: 99%
“…(TTF)(TCNQ) electrodes also work well in n-channel transistors based on DM-DCNQI and F 16 CuPc. 46,69 In the latter case, we have constructed ambipolar transistors using a heterostructure consisting of a double layer of CuPc and F 16 CuPc. In the former case, the expected order of the electrode metal dependence is Ag > Cu > Au, but the actually observed one is Au > (TTF)(TCNQ) > Ag > Cu.…”
Section: ç Charge-transfer Complexes As Electrodesmentioning
confidence: 99%