1998
DOI: 10.4028/www.scientific.net/msf.289-292.193
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Contact Electric Resistance (CER) Technique for In-Situ Characterisation of Surface Films

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Cited by 15 publications
(8 citation statements)
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“…31 As indicated above, when contacting mechanically two rough surfaces, the real contact area is always less than the nominal contact area. 34 The real contact area can be estimated by measuring the resistance of a metal rod and comparing the result with the CER response of the same rod cut into two pieces and inserted in the sample holders of the CER equipment.…”
Section: Methodsmentioning
confidence: 97%
“…31 As indicated above, when contacting mechanically two rough surfaces, the real contact area is always less than the nominal contact area. 34 The real contact area can be estimated by measuring the resistance of a metal rod and comparing the result with the CER response of the same rod cut into two pieces and inserted in the sample holders of the CER equipment.…”
Section: Methodsmentioning
confidence: 97%
“…After pretreatment, the working and the Ir electrodes were brought in contact by the step motor driven system used in CER measurements [23,29]. The contact was opened only when the desired conditions (temperature and pressure) have been established in the autoclave.…”
Section: Apparatus and Proceduresmentioning
confidence: 99%
“…Briefly, in order to consider an impedance spectrum measured in the contact situation valid, its low-frequency limit should be independent on the contact pressure applied to the electrodes and it should be equal to the value measured by a four-point dc method to exclude the influence of the spreading resistance of the contact on the frequency response [43]. Both criteria were checked by measuring impedance spectra at pressures ranging from 0.3 to 7 MPa together with the resistance by the CER technique which is a four-point measurement method [28,29]. It has been found that the low-frequency limit of the impedance decreases with increasing contact pressure and reaches a constant value for a pressure of 3.5-4 MPa, which is still ca.…”
Section: Impedance Spectra In the Symmetrical Configuration And Theirmentioning
confidence: 99%
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“…Recently, a combination of impedance measurements in an asymmetrical and a symmetrical configuration has been employed to characterize the conduction mechanism of the passive film on pure Fe [36], Fe-Cr and Fe-Cr-Mo alloys [37] in a borate solution at room temperature. The CEI measurements in the symmetrical configuration are an extension of the CER technique [38,39] to the frequency domain [33,36,37]. TLEC is used to measure the asymmetric configuration.…”
Section: Symmetrical and Asymmetrical Configurations For In Situ Studmentioning
confidence: 99%