2004
DOI: 10.1016/j.jelechem.2003.08.030
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Conduction mechanism in oxide films on ferrous alloys studied by impedance spectroscopy in symmetrical and asymmetrical configurations

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Cited by 25 publications
(31 citation statements)
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References 57 publications
(135 reference statements)
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“…3,4,14,46 In the following, the relationship between the defect structure, ionic and electronic conduction is treated on the basis of the MCM for oxide films. 18,19 According to this model, the growth of the barrier layer proceeds into the steel by ingress of oxygen transported via oxygen vacancies ͑reaction sequence k 2 -k 4 coupled via the oxygen vacancy transport flux, Fig. 9͒.…”
Section: Discussionmentioning
confidence: 99%
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“…3,4,14,46 In the following, the relationship between the defect structure, ionic and electronic conduction is treated on the basis of the MCM for oxide films. 18,19 According to this model, the growth of the barrier layer proceeds into the steel by ingress of oxygen transported via oxygen vacancies ͑reaction sequence k 2 -k 4 coupled via the oxygen vacancy transport flux, Fig. 9͒.…”
Section: Discussionmentioning
confidence: 99%
“…Qualitatively similar spectra have been measured at the other temperatures and also in earlier work. 19,28 It is worth mentioning that no significant hysteresis between measurements performed from negative to positive potentials and vice versa has been found as long as the system has been allowed to reach a constant current density at each potential.…”
Section: B252mentioning
confidence: 99%
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