2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) 2016
DOI: 10.1109/apemc.2016.7522751
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Construction of an Integrated Circuit Emission Model of a FPGA

Abstract: OATAO is an open access repository that collects the work of Toulouse researchers and makes it freely available over the web where possible.

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Cited by 6 publications
(14 citation statements)
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“…ISE Xilinx tool performs a static timing analysis which gives a detailed report about the slack and the data path delays at the fast and slow PVT (Process/Voltage/Temperature) corners. For the construction of the IA, the pulse duration IJ is considered to be the median value of the interval whose boundaries are the maximum data path IJmax and the minimum data path IJmin given by the static timing report (4). The average dynamic current associated to a periodic pulsed waveform i(t) is calculated using (5).…”
Section: B Presentation Of the Ia Construction Methodology For A Fpgmentioning
confidence: 99%
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“…ISE Xilinx tool performs a static timing analysis which gives a detailed report about the slack and the data path delays at the fast and slow PVT (Process/Voltage/Temperature) corners. For the construction of the IA, the pulse duration IJ is considered to be the median value of the interval whose boundaries are the maximum data path IJmax and the minimum data path IJmin given by the static timing report (4). The average dynamic current associated to a periodic pulsed waveform i(t) is calculated using (5).…”
Section: B Presentation Of the Ia Construction Methodology For A Fpgmentioning
confidence: 99%
“…A 1 probe, as defined by the IEC 61967-4 standard has been placed between the ground pins of the FPGA and the ground reference of the test board in order to measure the return current flowing outside the circuit. Models of the PDN of the FPGA and of the test board have been constructed from S parameter measurements and electromagnetic simulations and previously validated [4].…”
Section: B Description Of the Test Boardmentioning
confidence: 99%
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“…. (12) Using the full-wave analysis method, the Y-parameters were calculated. The results are shown in Figure 13.…”
Section: Nomentioning
confidence: 99%
“…As for these matters, various research has been reported in the past years [11][12][13]. Reference [14] gives an overview of the EMC research focusing on chip-level.…”
Section: Introductionmentioning
confidence: 99%