2003
DOI: 10.3131/jvsj.46.377
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Construction and Evaluation of Coaxially Symmetric Mirror Electron Energy Analyzer with High Sensitivity, and Its Application to Coincidence Spectroscopy

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Cited by 15 publications
(9 citation statements)
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“…Further information on EICO studies of surfaces is available at the homepage of http://pfwww.kek.jp/eico/EICO.html. In this review we describe details of the latest (fourth) EICO analyzer [14,46] in Section 16.2 and a new electron-polar-angle-resolved-ion coincidence analyzer [47] in Section 16.3.…”
Section: Introductionmentioning
confidence: 99%
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“…Further information on EICO studies of surfaces is available at the homepage of http://pfwww.kek.jp/eico/EICO.html. In this review we describe details of the latest (fourth) EICO analyzer [14,46] in Section 16.2 and a new electron-polar-angle-resolved-ion coincidence analyzer [47] in Section 16.3.…”
Section: Introductionmentioning
confidence: 99%
“…Although the CMA is compact (26 mm×71 mm), it has a wide solid angle of 0.72 sr. We report the details of the APECS apparatus and the result of its application to the Si LVV Auger-Si 2p photoelectron coincidence spectrum of a clean Si(111) surface in the following sections. [47] and (b) a photograph [46]. OD stands for outer diameter.…”
Section: Introductionmentioning
confidence: 99%
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