2011
DOI: 10.1002/polb.22375
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Confined crystallization of PVDF and a PVDF‐TFE copolymer in nanolayered films

Abstract: Layer‐multiplying coextrusion was used in conjunction with isothermal recrystallization to study the confined crystallization of polyvinylidene fluoride (PVDF) and polyvinylidene fluoride‐tetrafluoroethylene (PVDF‐TFE) using polycarbonate (PC) and polysulfone (PSF) as confining materials. Three layered systems were produced (PC/PVDF, PSF/PVDF, and PC/PVDF‐TFE) with layer thicknesses ranging from 525 to 28 nm. The crystal morphology was affected by both layer thickness and recrystallization temperature. Specifi… Show more

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Cited by 65 publications
(57 citation statements)
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“…The discrepancy with the measured value of 46.0 implies that eq is not adequate. Further structural information such as crystal morphology and aspect ratio would be useful to test more advanced models using tortuosity factors and clarify this point …”
Section: Resultsmentioning
confidence: 99%
“…The discrepancy with the measured value of 46.0 implies that eq is not adequate. Further structural information such as crystal morphology and aspect ratio would be useful to test more advanced models using tortuosity factors and clarify this point …”
Section: Resultsmentioning
confidence: 99%
“…F (β) is the relative proportion of β‐phase, ρ is the density of the copolymer (1.78 g cm −3 ), ρ c is the density of the crystalline phase, calculated from the proportion F (β) (Fig. ) and the density of the α‐phase crystals (1.99 g cm −3 ) and β‐phase crystals (1.90 g cm −3 ) …”
Section: Discussionmentioning
confidence: 99%
“…, as reviewed by Takahashi et al). The classic Nielsen (eq ) and Cussler (eq ) “nanocomposite” models have been used to analyze the permeation properties of polyethylene terephthalate and PVDF, respectively: PP0=1Xv1+aXv/2 PP0=1Xv1+(aXv/2)2 where a is the aspect ratio of the crystallites. These two models are shown in Figure , for the two extreme cases of aspect ratio a = 1 and a = infinite.…”
Section: Discussionmentioning
confidence: 99%
“…Thickness effects in WAXD have also been observed in confined crystallization studies. 25 In the 7 lm control and 2 L PC/P(VDF-HFP) film, the meridional (020) WAXD reflection indicate an on-edge crystal orientation with the crystallographic b-axis perpendicular to the layers (Figs. 10(a) and 10(b)).…”
Section: Effect Of Layer Thickness On the Low Frequency Dielectricmentioning
confidence: 99%