Configuration and Routing Effects on the SET Propagation in Flash-Based FPGAs

New Reprogrammable and Non-Volatile Radiation-Tolerant FPGA: RT ProASIC®3

“…Nevertheless and because of the low TID performance of the programming control circuit, the TID limit of the FPGA core could not be improved to higher than 40 Krad in gammarays. In the next section, the SEE characterization and mitigation of the 0.13-µm ProASIC3 FPGAs will be heavily addressed [Rezgui et al, 2007a[Rezgui et al, , 2008b[Rezgui et al, & 2009.…”

Fault tolerant electronic system design

“…Flash-based FPGA Several radiation test campaigns had proven the immunity of commercial Flash-based FPGAs to upsets in their configuration memory cell [62]. Several works addressed the problem of SEUs in the user memory resources.…”

“…In the last years, science researchers have acknowledged SET as a forthcoming issue in digital technologies, especially due to the technology shrink [63]. Several works investigated the nature of SETs on Flash-based FPGAs, analyzing the propagation of the transient pulse through the combinational logic data path and routing resources [77,62]. Previous works reported radiation test experiment [14] and electrical fault injection [70] of SET propagating on custom circuits designed specifically to observe SETs, also some results on SET dependency on clock frequency have been presented in [11].…”

SRAM-Based FPGA Systems for Safety-Critical Applications: A Survey on Design Standards and Proposed Methodologies

“…Other effects of radiations on digital circuits are the Total Ionizing Dose (TID), i.e., accumulation of charge in the interface between the metal and oxide layers that cause an increase of power consumption and a decrease of circuit speed, and Single Event Transients (SETs), i.e., transient impulses on wires in the circuit. Neither TID or SETs have been widely studied in SRAM-based FPGAs since these devices are much more susceptible to SEUs, but they must be considered when other FPGA technologies are used [63,52].…”