2018
DOI: 10.1002/aelm.201800586
|View full text |Cite
|
Sign up to set email alerts
|

Conducting Bridge Resistive Switching Behaviors in Cubic MAPbI3, Orthorhombic RbPbI3, and Their Mixtures

Abstract: exhibit low-operation voltages, reduced power consumption, high on/off ratios, and remarkable mechanical flexibility. [9,16] These outstanding properties are suitable for next-generation resistive switching memories. However, the present HPbased resistive switching memories have critical weaknesses, such as short endurance and poor air-stability. Even though conventional CBRAMs recorded over 10 6 cycles of endurance, halide perovskite based resistive switching devices exhibited around 10 3 cycles of endurance.… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
26
0

Year Published

2020
2020
2022
2022

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 34 publications
(27 citation statements)
references
References 55 publications
1
26
0
Order By: Relevance
“…Accompanying the progress toward high‐performance organic resistive memory devices, considerable endeavors have been dedicated to clarifying the underlying mechanisms of the switching characteristics. Although there still exist certain ambiguities, several referable memory mechanisms have been proposed on the basis of theoretical calculations and experimental analysis, which are closely correlated with the active materials and electrodes used in the devices 15,58‐61 . Here, we enumerate the most common and widely accepted switching mechanisms in the field of organic resistive memory devices, including charge transfer (CT), charge trapping, conformational change, redox reaction, and filamentary conduction (Figure 4).…”
Section: Memory Device Structure Switching Types and Mechanismsmentioning
confidence: 99%
See 1 more Smart Citation
“…Accompanying the progress toward high‐performance organic resistive memory devices, considerable endeavors have been dedicated to clarifying the underlying mechanisms of the switching characteristics. Although there still exist certain ambiguities, several referable memory mechanisms have been proposed on the basis of theoretical calculations and experimental analysis, which are closely correlated with the active materials and electrodes used in the devices 15,58‐61 . Here, we enumerate the most common and widely accepted switching mechanisms in the field of organic resistive memory devices, including charge transfer (CT), charge trapping, conformational change, redox reaction, and filamentary conduction (Figure 4).…”
Section: Memory Device Structure Switching Types and Mechanismsmentioning
confidence: 99%
“…In this section, we pay our attention to recent progress in OIP‐based resistive switching memories 37,52,58,215‐225 . Previous studies have revealed that two mechanisms, ionic migration and charge trapping/detrapping, can account for the resistive switching behaviors of OIPs, 218,219 which guided a series of materials design.…”
Section: Organic‐inorganic Hybrid Materials For Resistive Memorymentioning
confidence: 99%
“…On the basis of theoretical and experimental analysis, ion migration has been recognized as a reasonable mechanism in a variety of memristors, which is closely correlated with the active materials and electrodes used in the devices [38,56,57]. Mobile ions (cations and/or anions) can migrate through the active material with the assistance of external electric field.…”
Section: Ion Migrationmentioning
confidence: 99%
“…For CB-RRAM, an electroforming process is often required to generate conduction filaments based on the migration of metal ions or particles, which is typically conducted by exerting a high voltage/current to the resistive switching device [56,57]. Nevertheless, the application of high voltage is not desirable for the low power consumption.…”
Section: Ion Migrationmentioning
confidence: 99%
“…In addition, HPs can react with the top electrode of RSM and form derivatives that can adversely affect the switching characteristics. 19,37 Thus, it is essential to introduce an additional layer that can prevent these phenomena.…”
Section: ■ Introductionmentioning
confidence: 99%