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2019
DOI: 10.1109/tc.2019.2895074
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Concurrent Error Detectable Carry Select Adder with Easy Testability

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Cited by 11 publications
(10 citation statements)
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“…The proposed design with self-checking property is compared in terms of area overhead and fault coverage with the reported self-checking CSeA in [10] and [12]. Also, the proposed self-repairing HA is compared with self-repairing CoSA approach [19] and reduced precision TMR [17].…”
Section: Results and Benchmarkmentioning
confidence: 99%
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“…The proposed design with self-checking property is compared in terms of area overhead and fault coverage with the reported self-checking CSeA in [10] and [12]. Also, the proposed self-repairing HA is compared with self-repairing CoSA approach [19] and reduced precision TMR [17].…”
Section: Results and Benchmarkmentioning
confidence: 99%
“…It can be observed from Table . 4 that the proposed design requires on average 50% more transistor count as compared to the standard CSeA design without self-checking. Whereas, the required number of transistors are reduced by 76.76% and 115% as compared to [12] and [10], respectively. It should be noted that the proposed approach also requires 68.68% less transistor count as compared to our previous proposed self-checking CSeA [11].…”
Section: A Comparison With Self-checking Cseamentioning
confidence: 99%
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“…Adders are primarily used as basic units in implementing digital signal processing (DSP) systems for applications like design of analog to digital converters (ADCs) and design of digital filters [8][9][10][11][12][13]. Different techniques are used in the design of a multi bit binary adder, for example ripple carry adder (RCA), carry increment adder (CIA), carry skip adder (CSkA), carry look ahead adder (CLA), carry select adder (CSlA), carry save adder (CSA), and carry bypass adder (CBA) [14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%