Computer-Aided Measurement of Relative Retardations in Plane Photoelasticity

Hecker, F. W.; Morche, B.

doi:10.1007/978-94-009-4416-9_58

Cited by 54 publications

(38 citation statements)

References 3 publications

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“…Thus, the retardance y of a generic optical quarter wave plate becomes y = 90 ~ + ~ = 90 ~ + 360e (16) where s and e are the retardance error of quarter wave plates expressed in degrees and fringe orders, respectively. For a retardance tolerance of 4-15 nm, the error ~ for yellow light is within the range 4-9 ~ that is, :k0.025 fringe orders.…”

Section: The Influence Of Errors Of the Quarter Wave Platementioning

confidence: 99%

Computer aided photoelasticity by an optimum phase stepping method

Barone

Burriesci

Petrucci

2002

Experimental Mechanics

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ABSTRACT--In this paper an automated photoelastic method based on the phase stepping technique is described. It provides full-field maps of the isoclinic parameter and the relative retardation. The technique is based on processing six images of a photoelastic specimen acquired using plane and circularly polarized light. The number of acquisitions and the type of polariscope used in this approach have been chosen with the aim at reducing the influence of quarter wave plate errors and obtaining raw photoelastic data in a periodic form suitable for easy applications of automatic unwrapping routines.

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Section: The Influence Of Errors Of the Quarter Wave Platementioning

confidence: 99%

Computer aided photoelasticity by an optimum phase stepping method

Barone

Burriesci

Petrucci

2002

Experimental Mechanics

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“…(6). Due to the complexity of the procedure, it seems to be useful in cases in which it is not possible to realize the calibration specimen and the calibration procedure proposed in the article is performed directly on the model to be analysed, as a form of self-calibration.…”

Section: Birefringent Coatingsmentioning

confidence: 99%

“…The Phase Shifting Method (PSM) in monochromatic light, introduced in 1986 by Hecker and Morche [6], generally requires at least four acquisitions. After the pioneering work of Hecker and Morche, a significant contribution was made by Patterson and Wang [7], who proposed a method based on the use of circularly polarized light incident on the model and six positions of the analyzer and its quarter wave plate.…”

Section: Introductionmentioning

confidence: 99%

Review of RGB photoelasticity

Ajovalasit

Petrucci

Scafidi

2015

Optics and Lasers in Engineering

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“…which is different from expressions used in ordinary phasestepping methods (see for example Hecker & Morche, 1986). …”

Section: Methods To Measure the Retardance And Extinction Anglementioning

confidence: 69%

Images of absolute retardance L.Δn, using the rotating polariser method

Geday

Kaminsky

Lewis

et al. 2000

Journal of Microscopy

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Modulation techniques for measuring changes in optical birefringence, such as the rotating‐polariser method (Wood & Glazer, 1980, J. Appl. Crystallogr. 13, 217), allow one to determine |sin δ|, δ = 2πLΔn/λ, Δn= double refraction, L = light path and λ = wavelength. However, they generally suffer from not providing absolute values of the optical retardance or are limited to relatively low retardance values. In addition, knowledge of the absolute phase is required when establishing the correct values of optical orientation information. In this paper, it is shown how the phase δ, and thus optical retardance, can be extracted from combining measurements of |sin δ| at different wavelengths. The new approach works on each single point of a 2‐D picture without the need to correlate with neighbouring points. There is virtually no limit to the retardance, and the computational efforts are small compared with other methods (e.g. Ajovalasit et al. 1998, J. Strain Analysis 33, 75). When used with imaging techniques, such as the rotating polariser method of Glazer, Lewis & Kaminsky 1996 (Proc. R. Soc. London SeriesA452, 2751) this process has the potential to identify automatically optically anisotropic substances under the microscope. The algorithm derived in this paper is valid not only for birefringence studies, but can be applied to all studies of interfering light waves.

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Computer-Aided Measurement of Relative Retardations in Plane Photoelasticity

Cited by 54 publications

References 3 publications

Computer aided photoelasticity by an optimum phase stepping method

Computer aided photoelasticity by an optimum phase stepping method

Review of RGB photoelasticity

Images of absolute retardance L.Δn, using the rotating polariser method

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