The dependences of resistivity and Hall coefficient on magnetic field (0 < B < 5 T) and temperature (1.6 K < T < 300 K) of nand p-type Cd,Hg, -,Te (X x 0.17 to 0.22) samples with anodic oxide and sulphide passivative films are investigated. The data obtained confirm the principally different influence of both coatings on the parameters of the semiconductor surface layer. The basic parameters characterizing the surface size-quantized layer arising during anodic oxidization of the surface of the CdHgTe samples are determined. Bending of conduction and valence bands at the semiconductor interface is described well by the uncompensated positive charges formed by oxide native defects, i.e., oxygen vacancies. A method to study a quasi-two-dimensional electron gas without preparing an MOS-structure with a field electrode is proposed.Hgi-,Te (X % 0.17 IIO 0.22) C aHOAHbIMU OKCK.4HbIM A CYJIb@EU(HbIM IIaCCABApyIOl4MMA IIOKPblTAflMH. n0nyYeHHbIe AdHHbIe CBAneTenbCTByIOT 0 IIpAHUAIIHaJIbHOM pa3nli'illkl ne8CTBAX nByX IIaCCABApyIol4AX IIOKpbITAfi H a napaMeTpbI IIpHIIOBepXHOCTHOrO CJIOX IIOJIyIIpOBOnHAKa. OIIpenenCHbl OCHOBHbIe IIapaMeTpbI, XapaKc-TepA3yIOqAe IIpAIIOBepXHOCTHbIfi pa3MepHO-KBaHTOBaHHblfi IIpOBOAflI4Ag CnOfi, B03HAKaH3IUAfi IIpA aHOAHOM OKACJEHAA IIOBepXHOCTA (Cd, Hg)Te A3-3a npklCyTCTBAfl R IIaCCABApy€Ol4efi nneHKe npOCTpaHCTBeHH0 paCIIpeJU2neHHLdX IIOnOXHTeJIbHblX BCTpOeHHbTX 3apflnOB, 06pa3yeMblX CO6CTBeH-HCCJIenOBaTb CBOfiCTBa KBa3HnByMepHOrO 3JIeKTpOHHOrO Ta3a He npa6eran K A3TOTOBJIeHAIO MOS CTpYKTYp C IIOJIeBbIM 3neKTpOnOM. HbIMA ne@exTaMA oKmxa -BaKaHcxxMa mcnopona. npennoxeaa MeTonma, no3~onxroqaa