Complex permittivity measurements of low-loss microwave ceramics employing higher order quasi TE_0npmodes excited in a cylindrical dielectric sample

Abstract

Higher order quasi TE0np modes have been used for precise measurements of permittivity and dielectric loss tangent of low-loss dielectric ceramics versus frequency in the microwave frequency range. It has been shown that, using this technique, dielectrics having arbitrary permittivity value and dielectric loss tangent values in the range 10−6–10−2 can be measured with relative uncertainties below 0.5% for real permittivity and below 5% for dielectric losses. Several dielectric materials have been measured including single- crystal quartz, single-crystal sapphire and the low-loss microwave ceramics BMT, BZT and BZNT.

Measurements of Permittivity, Dielectric Loss Tangent, and Resistivity of Float-Zone Silicon at Microwave Frequencies

“…High-resistivity silicon has dielectric loss tangents of the order of 10 10 at room temperature and microwave frequencies. Therefore, techniques that have been used for measurements of its complex permittivity were the same as that used for dielectrics [11]- [14]. Most of the measurements were performed using the quasimode.…”

Measurements of the Complex Permittivity of Low Loss Polymers at Frequency Range From 5 GHz to 50 GHz

“…Dimensions of samples that were used in experiments are presented in Table I. Detailed description of the method which employs quasi TE 0mn modes can be found in [14]. Here we will only recall major factors that should be taken into account in the choice of dimensions and modes that provide the highest resolution of the dielectric loss measurement.…”

“…The dielectric loss tangent of samples under test tan δ for any of quasi TE 0mn modes is evaluated from the formula (1) [14] tan…”

“…Dielectric resonator methods usually employ quasi TE 011 mode (often called the TE 01δ mode) excited in test samples [10]. It has been already proven that also quasi TE 0mn [14] and whispering gallery modes excited in cylindrical specimens can be used for measurements of high permittivity of low loss materials and they are applicable in frequency range from 2 GHz to 100 GHz. In this letter the dielectric resonator method employing quasi TE 0mn modes is used for the complex permittivity measurements of low loss low permittivity polymers namely Polytetrafluoroethylene (PTFE), Polypropylene (PP), Polyethylene (PE) and cross-linked Polystyrene (Rexolite) at frequency range from 5 GHz to 50 GHz.…”

Parametric History Analysis for Material Properties Using Finite Elements and Adaptive Perturbations

“…This frequency shift has been used to determine the electrical properties of perturbers in context of waveguides, cavities or dielectric resonators [3]- [9]. In order to assess the accuracy of the calculation in such setups, the geometrical perturbation of these structures have been studied extensively in the literature [10]- [12].…”