Abstract:We present complex dielectric permittivity measurements of various semiconductor and dielectric materials, including highly absorbing substances, in Q-, V-and W-band frequencies. The measurements have been done using broadband quasi-optical millimeter wave system with a backwardwave oscillator as a high power source of radiation. Frequency dependencies of real and imaginary parts of dielectric permittivity are calculated from the transmittance spectra. Complex dielectric permittivity data, obtained using both … Show more
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