Compensation of output error due to the change of input intensity in an optical wavemeter based on a polarization interferometer

The accuracy of the current wavelength meter using optical interferometry is limited by the numbers of fringe counted. To solve this problem, a novel laser wavelength meter based on the measurement of synthetic wavelength is proposed. The unknown wavelength is obtained by measuring the value of synthetic wavelength produced by the unknown and reference wavelengths, and half of this value corresponds to 2π variation of the phase difference between the interference signals of the unknown and reference wavelengths. The optical configuration of the wavelength meter is designed and the measurement principle is analyzed theoretically. To verify its feasibility, three helium-neon lasers' wavelengths were determined experimentally, and a relative uncertainty on the unknown wavelength of the order of 10(-8) was realized. Accuracy analysis shows that this wavelength meter has the advantage of high accuracy when the unknown wavelength is around the standard laser wavelength recommended by CIPM.

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A novel laser wavelength meter based on the measurement of synthetic wavelength

Yan

Chen

Yang

et al. 2010

Review of Scientific Instruments

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Compensation of output error due to the change of input intensity in an optical wavemeter based on a polarization interferometer

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A novel laser wavelength meter based on the measurement of synthetic wavelength

A novel laser wavelength meter based on the measurement of synthetic wavelength

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