Compendium of TID, Neutron, Proton and Heavy Ion Testing of Satellite Electronics for Los Alamos National Laboratory

Fairbanks, Thomas D.; Quinn, Heather; Tripp, Justin L.; Michel, John; Warniment, Adam; Dallmann, Nick

doi:10.1109/redw.2013.6658191

Cited by 10 publications

(5 citation statements)

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“…An experimental evaluation of the ECC efficiency is presented in the following section. These results are very reasonable given the small feature size, especially since many other microprocessor components have higher MCU/MBU rates [23].…”

Section: Fig 4 Shows the Bit Cross-sections For The Different Test Csupporting

confidence: 52%

Modern GPUs Radiation Sensitivity Evaluation and Mitigation Through Duplication With Comparison

Oliveira

Rech

Quinn

et al. 2014

IEEE Trans. Nucl. Sci.

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Graphics processing units (GPUs) are increasingly common in both safety-critical and high-performance computing (HPC) applications. Some current supercomputers are composed of thousands of GPUs so the probability of device corruption becomes very high. Moreover, the GPU's parallel capabilities are very attractive for the automotive and aerospace markets, where reliability is a serious concern. In this paper, the neutron sensitivity of the modern GPU caches, and internal resources are experimentally evaluated. Various Duplication With Comparison strategies to reduce GPU radiation sensitivity are then presented and validated through radiation experiments. Threads should be carefully duplicated to avoid undesired errors on shared resources and to avoid the exacerbation of errors in critical resources such as the scheduler.

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Section: Fig 4 Shows the Bit Cross-sections For The Different Test Csupporting

confidence: 52%

Modern GPUs Radiation Sensitivity Evaluation and Mitigation Through Duplication With Comparison

Oliveira

Rech

Quinn

et al. 2014

IEEE Trans. Nucl. Sci.

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“…The results of these tests showed that most of the components are sensitive to SEUs, fewer are sensitive to SETs, while the flash based MSP430 and feRAM based MSP430 were sensitive to high current and SEL [3]. Tairbank et al [4] tested two microcontrollers LPC2148 produced by NXP Semiconductors and STM32F417IGH6 manufactured by STMicro. The TID test results showed that the flash of the LPC2148 can no longer be written after 20-25 krad (Si), most parts are non-functional above 55 krads (Si), some latchup or high current events in neutron, and destructive latch in Xenon LET =58.78 Mev-cm2/mg where the LET stands for "Linear Energy Transfer" which characterizes the energy lost along its linear path in silicon.…”

Section: Related Workmentioning

confidence: 99%

“…While, STM32F417IGH6 showed two SEUs events in neutron irradiation. The test done on evaluation board where SEUs observed in proton and non-destructive latch-ups observed with all ions> LET=2.19 Mev-cm2/mg [4]. Hirofuni [5] used COTS components for development of cub-satellites.…”

Section: Related Workmentioning

confidence: 99%

“…It is an online service provided by ESA that includes many industry-standard space radiation effects analysis tools in an easy-to-use interface. [7] Paper: ASAT-17-133-US 3/8 Firstly, the TID will be calculated theoretically using SHIELDDOSE2 model (with shield 1mm) for one year [4]. The SHIELDDOSE2 is a Model in SPENVIS package [7].…”

Section: A Definition Of Radiation Environment and Its Effectsmentioning

confidence: 99%

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Total Ionizing Dose Effects on Commercial ARM Microcontroller for Low Earth Orbit Satellite Subsystems

Akah

Elfiky

Shahin

et al. 2017

International Conference on Aerospace Sciences and Aviation Tec

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Despite the harshness of the space radiation on satellite electronic components, some Commercial Of The Shelf (COTS) can sustain such harsh environment. Thus, the low-cost advantage of the COTS can be utilized given that these electronic components meet the technical design requirements of the targeted satellite subsystem. Because of the complexity of microcontrollers and their various integrated functionality, they present a hardness assurance challenge. A careful technique was followed in analyzing the space radiation effects. Then rigorous tests should be conducted to test the performance of the candidate microcontrollers under these effects. This paper presents the predicted dose depth curve and the total ionizing does test results for a commercial ARM microcontroller for Low Earth Orbit (LEO) satellites. Such test results help estimate the effect of space environment on the microcontroller and decide if such microcontroller is an accepted candidate for LEO missions or not.

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“…Recent publications have studied more modern microprocessors [9], [10] with reduced feature sizes and multiple processing cores. The authors have also previously published results for the NXP LPC2148FBD64 and the ST Microelectronics STM32F417IG [11]. Both the NXP LPC2148FBD64 and the ST Microelectronics STM32F417IG exhibited problems with high-current events and single-event latchup, so testing of other microprocessors was completed in 2013 and 2014.…”

Section: Introductionmentioning

confidence: 99%

Single-Event Effects in Low-Cost, Low-Power Microprocessors

Quinn

Fairbanks

Tripp

et al. 2014

2014 IEEE Radiation Effects Data Workshop (REDW)

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Abstract-ARMs and microcontrollers are low-cost, low-power microprocessors that are frequently used in embedded computing. While not immune to the naturally occurring radiation environment in space, these microprocessors can be worthwhile replacements for spacegrade microprocessors for non-mission-critical computational tasks. In this paper results from radiation testing for several available ARMs and microcontrollers are presented.

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Compendium of TID, Neutron, Proton and Heavy Ion Testing of Satellite Electronics for Los Alamos National Laboratory

Cited by 10 publications

References 0 publications

Modern GPUs Radiation Sensitivity Evaluation and Mitigation Through Duplication With Comparison

Modern GPUs Radiation Sensitivity Evaluation and Mitigation Through Duplication With Comparison

Total Ionizing Dose Effects on Commercial ARM Microcontroller for Low Earth Orbit Satellite Subsystems

Single-Event Effects in Low-Cost, Low-Power Microprocessors

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