Single-Event Effects in Low-Cost, Low-Power Microprocessors

Abstract

Abstract-ARMs and microcontrollers are low-cost, low-power microprocessors that are frequently used in embedded computing. While not immune to the naturally occurring radiation environment in space, these microprocessors can be worthwhile replacements for spacegrade microprocessors for non-mission-critical computational tasks. In this paper results from radiation testing for several available ARMs and microcontrollers are presented.

Modern GPUs Radiation Sensitivity Evaluation and Mitigation Through Duplication With Comparison

“…In both cases, there is not a significant pattern-based difference in sensitivities for either type of memory. These bit cross sections are similar to other components with SRAM cells, including the Xilinx Virtex-7 field-programmable gate array (FPGA) [21] and many other types of microprocessors [22]. Fig.…”

Evaluation of fault injection tools for reliability estimation of microprocessor-based embedded systems

“…An MSP430 processor was selected to perform the fault campaigns. This processor is often used within the scientific community to test radiation effects on processor-based systems for early analysis of reliability and fault tolerance properties [35,36]. The selected tools and their main features are described below.…”

Total Ionizing Dose Effects on Commercial ARM Microcontroller for Low Earth Orbit Satellite Subsystems

“…Firstly, a survey was conducted to select appropriate COTS components for the telemetry subsystem as will be demonstrated in this section. Quinn et al [3] select different Microprocessors (MSP430, Hercules, Stellaris, Tiva and Zynq) to replace space hardened microprocessors, due to its lower cost and power, but they were not tested for radiation sensitivity. The tested microprocessors went through SEL, SEU, and SET tests.…”

“…The tested microprocessors went through SEL, SEU, and SET tests. The results of these tests showed that most of the components are sensitive to SEUs, fewer are sensitive to SETs, while the flash based MSP430 and feRAM based MSP430 were sensitive to high current and SEL [3]. Tairbank et al [4] tested two microcontrollers LPC2148 produced by NXP Semiconductors and STM32F417IGH6 manufactured by STMicro.…”