1990
DOI: 10.1016/s0040-6090(05)80051-3
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Comparison of tungsten and nickel oxideelectrochromism in single films and in all-solid-state devices

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Cited by 34 publications
(6 citation statements)
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“…Ottermann et al [29] claimed a correlation of linear dependence between the increase of W 5+ and the intercalation coefficient a i (H a i WO 3Àz ) for a i o0.25. For a i 40.3, the spectra are more complicated since a third binding state appears, presumably W 4+ .…”
Section: Surface Compositions Oxygen Deficiency and Electrochromic Pmentioning
confidence: 99%
“…Ottermann et al [29] claimed a correlation of linear dependence between the increase of W 5+ and the intercalation coefficient a i (H a i WO 3Àz ) for a i o0.25. For a i 40.3, the spectra are more complicated since a third binding state appears, presumably W 4+ .…”
Section: Surface Compositions Oxygen Deficiency and Electrochromic Pmentioning
confidence: 99%
“…Nickel oxide has excellent chemical stability with a wide band gap in the range 3.6-4.0 eV [24]. Various processes were attempted to synthesize NiO thin films including sputtering [25,26], electron beam evaporation [27,28], and the sol-gel technique [29], etc. If the NiO films were defect free (i.e.…”
Section: Introductionmentioning
confidence: 99%
“…The optical absorption is caused by small polaron transitions between two adjacent non‐equivalent sites of tungsten (${\rm W}_{4{\rm f}5/2}^{5 + }$ and ${\rm W}_{4{\rm f}7/2}^{6 + }$ ) as given in Equation (5):11 Figure 4(b) shows the compositions of ${\rm W}_{4{\rm f}5/2}^{5 + }$ (38.03 eV) and ${\rm W}_{4{\rm f}7/2}^{6 + }$ (35.85 eV) were 42 and 58%, respectively. Ottermann et al reported a correlation of linear dependence between the increase of ${\rm W}_{4{\rm f}5/2}^{5 + }$ and the insertion coefficient x (H x WO 3‐ z ) for x <0.25 12. In this study, the insertion coefficient x (Li x WO 3‐ z ) of the FECD was found to be 0.14–0.15 for 200 cycles of ion insertion and extraction in a 0.1 M LiClO 4 ‐PC electrolyte.…”
Section: Resultsmentioning
confidence: 99%