2011
DOI: 10.3938/jkps.58.1184
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Comparison of the Measured Stem Leakage Correction Factor for an Ionization Chamber in Air to the Monte Carlo Simulation

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Cited by 2 publications
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“…Therefore, the Compton current for MV x rays should be explained not only by recoil electrons due to Compton scattering but also positrons, because of pair production as expressed in Eq. (9). Although the MC simulation may be useful for analyzing the Compton current, information on precise structure and materials is essential.…”
Section: Discussionmentioning
confidence: 99%
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“…Therefore, the Compton current for MV x rays should be explained not only by recoil electrons due to Compton scattering but also positrons, because of pair production as expressed in Eq. (9). Although the MC simulation may be useful for analyzing the Compton current, information on precise structure and materials is essential.…”
Section: Discussionmentioning
confidence: 99%
“…The stem effect in the photon beam is explained by two mechanismsstem leakage and stem scatteraccording to multiple reports. [6][7][8][9][10][11] Stem leakage arises as a consequence of direct irradiation to insulators in the stem and the stem scatter arises from scattered radiation in the stem that reaches the ionization cavity or collector electrode. For some chambers with a short stem, scatter also arises from the cable.…”
Section: Introductionmentioning
confidence: 99%
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