2011 37th IEEE Photovoltaic Specialists Conference 2011
DOI: 10.1109/pvsc.2011.6185854
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Comparison of PV module performance before and after 11 and 20 years of field exposure

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Cited by 72 publications
(33 citation statements)
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“…The fill factor, I-V curve parameter, and bypass diode variations found in the tested arrays have been similarly reported in other literature [1,6,11] and are assumed typical of arrays that have experienced some field degradation in the Southwest US.…”
Section: A I-v Parameter Distributionsupporting
confidence: 77%
“…The fill factor, I-V curve parameter, and bypass diode variations found in the tested arrays have been similarly reported in other literature [1,6,11] and are assumed typical of arrays that have experienced some field degradation in the Southwest US.…”
Section: A I-v Parameter Distributionsupporting
confidence: 77%
“…Several cases of PV module degradation caused by single UV exposure have been reported, for example, the delamination at the glass=encapsulant or cell=encapsulant interface, 5,6,9,12) the discoloration of the encapsulant [1][2][3][4]6,[9][10][11]13) and backsheet, [14][15][16] and recently the production of acetic acid in the encapsulant. [17][18][19] However, current standard PV module qualification tests such as IEC 61215 are considered insufficient for the evaluation of UV impact as well as the combined effect of multiple factors on PV modules.…”
Section: Introductionmentioning
confidence: 99%
“…As explained in Section 3, crystalline silicon PV cells have been shown to present an annual degradation of the short-circuit current between -0.5%/year and -0.8%/year, whereas V oc and V mp are assumed to remain constant [41][42][43][44][45]. The coefficient of variation (CV) of I sc , which has been reported to increase with time from 1% in year 0 to 10% in year 25, is consequently assumed to increase linearly at 0.36%/year [43].…”
Section: A2 Aging Of Photovoltaic Modules Under a Standard Operationmentioning
confidence: 99%