Comparison of mass spectrometric and optical measurements of temperature and electron density in the inductively coupled plasma during mass spectrometric sampling

Inductively coupled plasma-mass spectrometry: insights through computer modeling

“…For instance, the groups of Farnsworth, Hieftje and Houk studied the downstream region from the sampling interface, [5][6][7][8] but they did not give information on changes in the plasma itself. Several groups also investigated the plasma region itself, [9][10][11][12][13][14][15][16][17] but without comparison of plasma characteristics in the presence of the interface to the same characteristics in the absence of the interface. On the other hand, a detailed comparison of the plasma characteristics with and without sampling interface was performed by the groups of Houk, 18,19 Farnsworth 20 and Hieftje.…”

The effect of the sampling cone position and diameter on the gas flow dynamics in an ICP

“…A detailed discussion about the boundary layer between the plasma stream and the sampler orice, as well as sample introduction, ionization and ion extraction in ICP-MS was presented in 1981 by Houk et al 1 Later on, several studies were performed to investigate the inuence of a MS sampler, both upstream and downstream from the interface cone. [2][3][4][5][6][7][8][9][10][11][12][13][14][15] In ref. 2-10, the upstream region, i.e., the plasma, was investigated, but no comparison was made with and without the sampling interface.…”

Effects of ionization potential of an element and boiling point of the corresponding oxide on the sensitivity of ICP-MS

“…19 The partition functions were calculated according to the method reported by de Galan et al 32 and the electron number density of the ICP was assumed to be 10 15 cm À3 . 33 Fig. 4 shows that the degree of ionization is low for elements of volatile oxides but relatively high ionization potential (Ni, Cu, Zn, as well as As, Cd, and Pb).…”