18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2011
DOI: 10.1109/ipfa.2011.5992781
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Comparison of classical and two-photon photoelectric laser stimulation capabilities for failure analysis

Abstract: This paper reviews important parameters for the two-photon absorption (TPA) laser stimulation technique and presents results concerning the characterization of the TPA effective spot size along lateral and axial directions. TPA scans are compared with classical photoelectric stimulation images to investigate TPA capabilities for failure analysis and design debug.

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