2006 IEEE 4th World Conference on Photovoltaic Energy Conference 2006
DOI: 10.1109/wcpec.2006.279477
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Comparison of Band Alignments at Various CdS/Cu(In,Ga)(S,Se)2 Inter-Faces in Thin Film Solar Cells

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Cited by 4 publications
(8 citation statements)
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“…As mentioned in the introduction, we have consistently found flat conduction alignments in optimized CIG(S)Sebased devices [12][13][14], with the exception of CdS/Cu(In, Ga)S 2 , for which a cliff was found [15]. Given the fact that the O/S ratio of the Zn(O,S) layer gives an additional optimization parameter for this alternative buffer layer, it is not necessarily to be expected that a flat conduction band alignment is found.…”
Section: Resultsmentioning
confidence: 91%
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“…As mentioned in the introduction, we have consistently found flat conduction alignments in optimized CIG(S)Sebased devices [12][13][14], with the exception of CdS/Cu(In, Ga)S 2 , for which a cliff was found [15]. Given the fact that the O/S ratio of the Zn(O,S) layer gives an additional optimization parameter for this alternative buffer layer, it is not necessarily to be expected that a flat conduction band alignment is found.…”
Section: Resultsmentioning
confidence: 91%
“…In other words: the (expected) downward band bending at the absorber surface is slightly reduced by the interface formation. This needs to be compared with the CdS/CIG(S)Se system, where we either find a negligible impact on the band edge positions or a small additional downward shift (unpublished). The here‐observed (small) upward shift could have several origins, including a small change in the CIGSe surface dipole upon becoming an interface dipole to the Zn(O,S) layer, and a possible charge transfer across the interface to influence the space‐charge region.…”
Section: Resultsmentioning
confidence: 99%
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“…3(b). For the buffer layers, we assume there is no defects with the following material properties for CdS (ZnO): [28][29][30] E g of 2.42 eV (3.37 eV), dielectric constant of 10 (8.5), electron affinity of 4.2 eV (4.5 eV) and a donor concentration at the order of 10 18 cm −3 .…”
Section: Scaps Device Simulationmentioning
confidence: 99%