We report on the chemical and electronic structure of the interface between a thermally co-evaporated In x S y buffer and a Cu 2 ZnSn(S,Se) 4 (CZTSSe) absorber for thin-film solar cells that, to date, has achieved energy conversion efficiencies up to 8.6 %. Using surface-sensitive x-ray and UV photoelectron spectroscopy, combined with inverse photoemission and bulksensitive soft x-ray emission spectroscopy, we find a complex character of the buffer layer. It includes oxygen, as well as selenium and copper that diffused from the absorber into the In x S y buffer, exhibits an electronic band gap of 2.50 ± 0.18 eV at the surface, and leads to a small cliff in the conduction band alignment at the In x S y /CZTSSe interface. After an efficiencyincreasing annealing step at 180 °C in nitrogen atmosphere, additional selenium diffusion leads to a reduced band gap at the buffer layer surface (2.28 ± 0.18 eV).