Comparison between different models for alpha-particle range determination and a new approach to CR-39 detector

Ghazaly, M. El; Salama, T.; Khalil, E.I.; Raouf, Kh. M. Abd El

doi:10.3938/jkps.61.336

Cited by 10 publications

(2 citation statements)

References 17 publications

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“…The CR-39 detector, which is characterized by high energy-and spatial resolution as well as a high detection efficiency of about 100% for normal incident heavy ions and alpha particles, must be scanned using a high spatial resolution optical microscope [1][2][3]. However, the scanned area of the CR-39 detector by an optical microscope is limited to some squared microns, depending on the objective lens power [1,3,[9][10][11]. For normal incident alpha particles, the etch pits in the CR-39 detector appear under an optical microscope as a solid black circle that is attributed to light scattering at the inclined walls of the alpha particle etch pits.…”

Section: Introductionmentioning

confidence: 99%

Low energy alpha particles dose mapping with a combination of CR-39 detector and a high resolution flatbed scanner

Mohamed,

Abdel-Mageed,

El Ghazaly

et al. 2024

Phys. Scr.

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The potential of a combination of the well-known CR-39 detector and a high-resolution flatbed scanner for low energy alpha particles dose mapping is investigated. The CR-39 detectors were irradiated with perpendicular incident 4 MeV alpha particles of doses 0.009, 0.018, 0.033, 0.051, 0.067, 0.134, and 0.164 Gy, thereafter, etched in 6.25 N NaOH at 70 °C. The CR-39 detectors were scanned with Canon CanScan 9000F Mark II of spatial resolution of 9600 dpi and color depth of 48 bit. The measurements reveal that the pixel values for different color channels are correlated linearly with 4 MeV alpha particles dose at the etching times of 2 h, 3 h, and 4 h. For blue channel, the maximum sensitivity was -53178  1463 pixel value/Gy at etching time of 4 h, compared to -15290  2004 pixel value/Gy, and -42255  840 pixel value/Gy at 2 h and 3 h respectively, the negative sign indicates the pixel values decrease as the 4 MeV alpha particles dose increases. While for etching times, 5 h and 6 h, the pixel values decrease exponentially as the 4 MeV alpha particles dose increases. For prolonged etching time, the pixel values are non-monotonic function of alpha particles dose. The optical density was evaluated as a function of etching time (removal thickness) of CR-39 irradiated with different doses. For 0.009 Gy, and 0.018 Gy doses of alpha particles, the optical density is linearly correlated with the etching time; for other doses, the optical density is not a monotonic function of the etching time. These new findings pave the way to use the combination of the CR-39 detector and high-resolution flatbed scanner for dose mapping of alpha particles and heavy ions over large-scale areas, applying etching conditions for each particle type and corresponding energy, that produce maximum sensitivity and linearity.

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Section: Introductionmentioning

confidence: 99%

Low energy alpha particles dose mapping with a combination of CR-39 detector and a high resolution flatbed scanner

Mohamed,

Abdel-Mageed,

El Ghazaly

et al. 2024

Phys. Scr.

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“…The most popular solid-state nuclear track, CR-39, is used in alpha particle spectrometry, and has a high sensitivity and detection efficiency in determining the type of alpha-particle producing radionuclides in experimental nuclear physics as well as biological and environmental materials [1][2][3][4][5]. The etch-pit track opening parameters and track profile length may be determined experimentally using the CR-39 detector, which can estimate the energy of the alpha particle [6][7][8][9][10][11][12][13]. The calibration curve between alpha particle energy and etch-pit track diameter is used in alpha particle spectrometry using the CR-39 detector, which is limited to a narrow energy range because the diameter of the track etch-pit is not a monotonic function of alpha particle energy, as reported in many papers [8,9].…”

Section: Introductionmentioning

confidence: 99%

Alpha particle spectrometry based on the mean grey level and visibility of track etch-pit in CR-39 Nuclear Track Detector

Al-Sayed¹,

Ghazaly²,

Ghanim³

et al. 2022

Phys. Scr.

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The CR-39 detector is used in this work to present an exceptional technique for alpha-particle spectrometry. This new approach is based on determining the mean grey level and visibility of the alpha particle track etch-pit. The latter is used to discriminate alpha particles of different energies that produce the same track diameter at the same etching time. CR-39 detectors had been irradiated by alpha particles with energies 1, 2, 3, 4, and 5 MeV thereafter are chemically etched in 6.25 M NaOH at 70 °C. At various etching periods, the diameter, the mean grey level, and the visibility of the alpha particle track etch-pit were measured. The findings reveal that for a given alpha particle, the mean grey level rises with the increase of the etching time. Conversely, both the visibility and contrast of alpha particle tracks are deteriorating. The alpha particle track etch-pit of equal diameters results from an alpha particle of different energies having different mean grey levels and visibility. In addition, it is confirmed that the mean grey level and visibility of the alpha particle etch-pit are shown to be correlated with the alpha particle energy at a particular etching time. Finally, the proposed approach is intended to overcome the non-monotonical relationship of diameter to the energy of alpha particle track etch-pit. So, our findings have the potential to broaden the application of CR-39 as an alpha particle spectrometer.

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Impact of Etchant Variables on the Track Parameters in CR-39 Polymer Nuclear Track Detector: A Review

Diwan

2019

Radiation Effects in Polymeric Materials

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Comparison between different models for alpha-particle range determination and a new approach to CR-39 detector

Cited by 10 publications

References 17 publications

Low energy alpha particles dose mapping with a combination of CR-39 detector and a high resolution flatbed scanner

Low energy alpha particles dose mapping with a combination of CR-39 detector and a high resolution flatbed scanner

Alpha particle spectrometry based on the mean grey level and visibility of track etch-pit in CR-39 Nuclear Track Detector

Impact of Etchant Variables on the Track Parameters in CR-39 Polymer Nuclear Track Detector: A Review

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