2015
DOI: 10.1016/j.jallcom.2014.11.150
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Comparative study on structural, morphological and optical properties of Zn2SnO4 thin films prepared by r.f. sputtering using Zn and Sn metal targets and ZnO–SnO2 ceramic target

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Cited by 37 publications
(15 citation statements)
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“…An average surface roughness of ~18Å was found by this measurement which was close to the ideal film properties. These good structure characteristics of the fabricated Zn 2 SnO 4 film have a good match with previous reported results (Mereu, Le Donne et al 2015), and were ideal to be used as a buffer layer. Therefore, we have then fabricated solar cell layers to form a solar cell device in the forms shown in Fig.…”
Section: Results and Discussion:-supporting
confidence: 87%
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“…An average surface roughness of ~18Å was found by this measurement which was close to the ideal film properties. These good structure characteristics of the fabricated Zn 2 SnO 4 film have a good match with previous reported results (Mereu, Le Donne et al 2015), and were ideal to be used as a buffer layer. Therefore, we have then fabricated solar cell layers to form a solar cell device in the forms shown in Fig.…”
Section: Results and Discussion:-supporting
confidence: 87%
“…It can be revealed that the fabricated Zn 2 SnO 4 buffer layer thin film exhibits near-zero absorptance, quite small reflectance and high optical transmittance particularly in the visible range and higher. These results showed good match with other research groups (Bapanapalli 2005, Mereu, Le Donne et al 2015. The bandgap calculation that was estimated by using the Tauc equation (Grahn 1999) shows that the Zn 2 SnO 4 buffer layer has a wide and close to ideal optical bandgap of (~3.4 eV) (Bapanapalli 2005).…”
Section: Results and Discussion:-supporting
confidence: 85%
“…The resistivity of Zn2SnO4 is usually higher than that of ZnSnO3 [19]. This is reflected well in literature data of conductivity for ITO (σ = 104 Ω -1 cm -1 [20]), for HRT layers as Zn2SnO4 (σ = 50-100 Ω -1 cm -1 [21,22]) and for ZnSnO3 (σ = 250 Ω -1 cm -1 [17,23]). It should be mentioned that the ZTO film's properties are critically dependent on the growth conditions.…”
Section: Introductionsupporting
confidence: 78%
“…The ZnO NW exhibits a broad peak centered at 443 cm -1 , which corresponds to the E2 mode for ZnO [34]. After deposition of the ZSO shell layer, that is, for the ZSO/ZnO HNA, two peaks, at 443 and 673 cm -1 , are observed, corresponding to the E2 mode for the ZnO and A1g modes (stretching vibration mode of SnO6 octahedra) of spinel-type Zn2SnO4 [35]. Consequently, a Zn2SnO4 shell layer with nanoparticle morphology was successfully formed on the ZnO NWs via thermal evaporation, followed by post-annealing.…”
Section: Resultsmentioning
confidence: 99%