Comparative Study of Total Ionizing Dose Effects on the Silicon-Controlled Rectifier Devices for HV and LV ESD Protections

Chen, Zhuojun; Lu, Wenzhao; Ming, Wu; Peng, Wei; Zeng, Yonghong; Jin, Xiangliang

doi:10.1109/ipfa47161.2019.8984825

2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) 2019

DOI: 10.1109/ipfa47161.2019.8984825

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Comparative Study of Total Ionizing Dose Effects on the Silicon-Controlled Rectifier Devices for HV and LV ESD Protections

Zhuojun Chen

Wenzhao Lu

Wu Ming

et al.

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Comparative Study of Total Ionizing Dose Effects on the Silicon-Controlled Rectifier Devices for HV and LV ESD Protections

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