“…Atomic force microscopy (AFM) provides detailed information on the surface characteristics of contact lenses (Bhatia et al, 1997;Baguet et al, 1993;Baguet et al, 1995;Bruinsma et al, 2003;Lira et al, 2008;Guryca et al, 2007;Gonzalez-Meijome et al, 2006a;Gonzalez-Meijome et al, 2009;Teichroeb et al, 2008;Maldonado-Codina and Efron, 2005) and is a powerful tool for the high resolution examination of the structure of the hydrated contact lens surface. The method has the advantages that it avoids artefacts due to dehydration and coating (Bhatia et al, 1997;Kim et al, 2002), and allows for non-destructive surface topography and roughness measurements.…”