2013
DOI: 10.1186/1556-276x-8-85
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Comparative study of initial stages of copper immersion deposition on bulk and porous silicon

Abstract: Initial stages of Cu immersion deposition in the presence of hydrofluoric acid on bulk and porous silicon were studied. Cu was found to deposit both on bulk and porous silicon as a layer of nanoparticles which grew according to the Volmer-Weber mechanism. It was revealed that at the initial stages of immersion deposition, Cu nanoparticles consisted of crystals with a maximum size of 10 nm and inherited the orientation of the original silicon substrate. Deposited Cu nanoparticles were found to be partially oxid… Show more

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Cited by 22 publications
(11 citation statements)
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“…Actually, island‐like morphology of copper species on TiO 2 surface suggests deposition‐reduction process occurred according to the Volmer‐Weber mechanism . Notably, the lattice parameters of the substrate, significantly affect the sizes and oxidation level of Copper deposits.…”
Section: Resultsmentioning
confidence: 99%
“…Actually, island‐like morphology of copper species on TiO 2 surface suggests deposition‐reduction process occurred according to the Volmer‐Weber mechanism . Notably, the lattice parameters of the substrate, significantly affect the sizes and oxidation level of Copper deposits.…”
Section: Resultsmentioning
confidence: 99%
“…Spontaneous Cu deposition has been reported upon immersion of PSi in aqueous solutions containing cupric ions as a result of the reductive character of this material. , Cu deposition has also been reported from a solution in methanol . Here, the metallization of the PSi samples was carried out by impregnation with a solution of CuMes in [C 1 C 4 Im]­[NTf 2 ].…”
Section: Resultsmentioning
confidence: 99%
“…containing cupric ions as a result of the reductive character of this material. [8][9][10][11]17 Cu deposition has also been reported from a solution in methanol. 16 Here, the metallization of the PSi samples was carried out by impregnation with a solution of CuMes in…”
Section: ■ Experimental Sectionmentioning
confidence: 94%
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“…The pore channel diameter limits the size of the grains, while on the outer PS surface crystals of copper can be in tens times higher, exceeding in some cases, the nanometer range. EBSD analysis of the outer PS surface (the analyzed thickness has been about 100 nm) after the copper deposition has shown that during the nucleation of grain and its initial growth to 2 nm metal inherits the crystallographic orientation of the initial silicon wafer (13). Further copper crystals growth leads to the coalescence of NPs into large aggregates or quasi continuous film.…”
Section: Introductionmentioning
confidence: 99%