2018
DOI: 10.1016/j.solener.2017.12.011
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Comparative analysis of parameter extraction techniques for the electrical characterization of multi-junction CPV and m-Si technologies

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Cited by 16 publications
(9 citation statements)
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“…This parameter shows a similar linear tendency as I 0 , with values ranging from 2.03 to 2.33 at 298 K and from 2.09 to 2.47 at 423 K. Similar to I 0 , the ideality factor is also related to the number of carriers and recombination rates, which could also explain their similar behaviour. This has been experimentally demonstrated by the authors in previous works concerning MJ‐based CPV systems [40, 33], and by other authors focused on the investigation of the SEM parameters of standard MJ cells [50]. However, it is widely assumed by the community that the ideality factor should be closer to the radiative limit, that is, m = 1 per PN junction, as the C ratio increases [41, 52], and [53].…”
Section: Impact Of Concentration and Temperature On The Parametersmentioning
confidence: 83%
See 1 more Smart Citation
“…This parameter shows a similar linear tendency as I 0 , with values ranging from 2.03 to 2.33 at 298 K and from 2.09 to 2.47 at 423 K. Similar to I 0 , the ideality factor is also related to the number of carriers and recombination rates, which could also explain their similar behaviour. This has been experimentally demonstrated by the authors in previous works concerning MJ‐based CPV systems [40, 33], and by other authors focused on the investigation of the SEM parameters of standard MJ cells [50]. However, it is widely assumed by the community that the ideality factor should be closer to the radiative limit, that is, m = 1 per PN junction, as the C ratio increases [41, 52], and [53].…”
Section: Impact Of Concentration and Temperature On The Parametersmentioning
confidence: 83%
“…Further, this is also key to overcoming the high computational demand of TCAD software, and therefore, to better understanding the performance of the device and possible limitations. Thus, the single exponential model (SEM) and the double exponential model have been studied for all PV technologies for decades [31][32][33][34][35]. The SEM, which is the most widely used, relates the I-V curve of a PV device with five characteristic parameters.…”
Section: Introductionmentioning
confidence: 99%
“…-Aluminium Back Surface Field (AL-BSF) Existen múltiples métodos de extracción de parámetros, por la afinidad del grupo de la PUCP con el grupo IDEA de la Universidad de Jaén, esta investigación se centró en los métodos analíticos de Khan et al [5] y Phang et al [6] que fueron investigados por Montes-Romero et al [7] y Fernández et al [8]. Ambos métodos fueron formulados para extraer los parámetros eléctricos de módulos de silicio policristalino utilizando puntos característicos de la curva IV experimental.…”
Section: Las Tecnologías De Película Delgada Bajo Estudio Fueronunclassified
“…The resulting parameter values were found to significant improvements, with less than a 5% error for most of the solar cells studied [8][9][10][11][12][13]. The double diode model (DDM) illustrated in Figure 2 is also widely used by researchers due to its higher accuracy where more parameters are used in this model, and therefore, more calculations are performed [14][15][16][17][18][19][20][21][22].…”
Section: Main Idea Of the Discrete Symbiotic Organisms Search (Dsos)mentioning
confidence: 99%