2015
DOI: 10.1364/josaa.32.002082
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Comparative analysis of imaging configurations and objectives for Fourier microscopy

Abstract: Fourier microscopy is becoming an increasingly important tool for the analysis of optical nanostructures and quantum emitters. However, achieving quantitative Fourier space measurements requires a thorough understanding of the impact of aberrations introduced by optical microscopes, which have been optimized for conventional real-space imaging. Here, we present a detailed framework for analyzing the performance of microscope objectives for several common Fourier imaging configurations. To this end, we model ob… Show more

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Cited by 102 publications
(92 citation statements)
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References 44 publications
(61 reference statements)
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“…35), and an electron-multiplying charge-coupled device (EMCCD) camera (Andor iXon Ultra 897). A custom-made polarization filter can be optionally inserted to limit collection polarization to a particular orientation with respect to the wire.…”
Section: Methodsmentioning
confidence: 99%
“…35), and an electron-multiplying charge-coupled device (EMCCD) camera (Andor iXon Ultra 897). A custom-made polarization filter can be optionally inserted to limit collection polarization to a particular orientation with respect to the wire.…”
Section: Methodsmentioning
confidence: 99%
“…The high NA objective is one likely contributor to these aberrations, as supported by recent studies of (global) aberrations in orientational imaging(181) and comparative modeling of Fourier microscopy configurations. (182)…”
Section: Challenges and New Developments In 3d Localizationmentioning
confidence: 99%
“…4 are given in Supplementary Table 1. A small amount of asymmetry was noted in the intensity of the lobes of the y-phi mask, which may be a result of small residual aberrations (e. g. coma) in the imaging system 27 (Supplementary Fig. 10 and accompanying text), or from imperfections in the mask itself.…”
Section: Methodsmentioning
confidence: 99%