Microelectronics Reliability
 2015
DOI: 10.1016/j.microrel.2014.10.015
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Compact failure modeling for devices subject to electrostatic discharge stresses – A review pertinent to CMOS reliability simulation

Meng Miao1,
Yuanzhong Zhou2,
Javier A. Salcedo3
et al.
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Cited by 9 publications
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